Special session on reliability and vulnerability of neuromorphic computing systems

Shimeng Yu, Chenchen Liu, Wujie Wen, Yiran Chen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This is the summary of the special session on reliability and vulnerability of neuromorphic computing systems.

Original languageEnglish (US)
Title of host publicationProceedings - 2018 IEEE 36th VLSI Test Symposium, VTS 2018
PublisherIEEE Computer Society
Number of pages1
Volume2018-April
ISBN (Electronic)9781538637746
DOIs
StatePublished - May 29 2018
Event36th IEEE VLSI Test Symposium, VTS 2018 - San Francisco, United States
Duration: Apr 22 2018Apr 25 2018

Other

Other36th IEEE VLSI Test Symposium, VTS 2018
CountryUnited States
CitySan Francisco
Period4/22/184/25/18

Keywords

  • neuromorphic
  • reliability
  • vulnerability

ASJC Scopus subject areas

  • Computer Science Applications
  • Electrical and Electronic Engineering

Cite this

Yu, S., Liu, C., Wen, W., & Chen, Y. (2018). Special session on reliability and vulnerability of neuromorphic computing systems. In Proceedings - 2018 IEEE 36th VLSI Test Symposium, VTS 2018 (Vol. 2018-April). IEEE Computer Society. https://doi.org/10.1109/VTS.2018.8368633

Special session on reliability and vulnerability of neuromorphic computing systems. / Yu, Shimeng; Liu, Chenchen; Wen, Wujie; Chen, Yiran.

Proceedings - 2018 IEEE 36th VLSI Test Symposium, VTS 2018. Vol. 2018-April IEEE Computer Society, 2018.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Yu, S, Liu, C, Wen, W & Chen, Y 2018, Special session on reliability and vulnerability of neuromorphic computing systems. in Proceedings - 2018 IEEE 36th VLSI Test Symposium, VTS 2018. vol. 2018-April, IEEE Computer Society, 36th IEEE VLSI Test Symposium, VTS 2018, San Francisco, United States, 4/22/18. https://doi.org/10.1109/VTS.2018.8368633
Yu S, Liu C, Wen W, Chen Y. Special session on reliability and vulnerability of neuromorphic computing systems. In Proceedings - 2018 IEEE 36th VLSI Test Symposium, VTS 2018. Vol. 2018-April. IEEE Computer Society. 2018 https://doi.org/10.1109/VTS.2018.8368633
Yu, Shimeng ; Liu, Chenchen ; Wen, Wujie ; Chen, Yiran. / Special session on reliability and vulnerability of neuromorphic computing systems. Proceedings - 2018 IEEE 36th VLSI Test Symposium, VTS 2018. Vol. 2018-April IEEE Computer Society, 2018.
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