Abstract
This is the summary of the special session on reliability and vulnerability of neuromorphic computing systems.
Original language | English (US) |
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Title of host publication | Proceedings - 2018 IEEE 36th VLSI Test Symposium, VTS 2018 |
Publisher | IEEE Computer Society |
Number of pages | 1 |
Volume | 2018-April |
ISBN (Electronic) | 9781538637746 |
DOIs | |
State | Published - May 29 2018 |
Event | 36th IEEE VLSI Test Symposium, VTS 2018 - San Francisco, United States Duration: Apr 22 2018 → Apr 25 2018 |
Other
Other | 36th IEEE VLSI Test Symposium, VTS 2018 |
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Country | United States |
City | San Francisco |
Period | 4/22/18 → 4/25/18 |
Keywords
- neuromorphic
- reliability
- vulnerability
ASJC Scopus subject areas
- Computer Science Applications
- Electrical and Electronic Engineering