Special session on reliability and vulnerability of neuromorphic computing systems

Shimeng Yu; Chenchen Liu; Wujie Wen; Yiran Chen

doi:10.1109/VTS.2018.8368633

Special session on reliability and vulnerability of neuromorphic computing systems

Shimeng Yu, Chenchen Liu, Wujie Wen, Yiran Chen

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

This is the summary of the special session on reliability and vulnerability of neuromorphic computing systems.

Original language	English (US)
Title of host publication	Proceedings - 2018 IEEE 36th VLSI Test Symposium, VTS 2018
Publisher	IEEE Computer Society
Number of pages	1
Volume	2018-April
ISBN (Electronic)	9781538637746
DOIs	https://doi.org/10.1109/VTS.2018.8368633
State	Published - May 29 2018
Event	36th IEEE VLSI Test Symposium, VTS 2018 - San Francisco, United States Duration: Apr 22 2018 → Apr 25 2018

Other

Other	36th IEEE VLSI Test Symposium, VTS 2018
Country	United States
City	San Francisco
Period	4/22/18 → 4/25/18

Keywords

neuromorphic
reliability
vulnerability

ASJC Scopus subject areas

Computer Science Applications
Electrical and Electronic Engineering

Access to Document

10.1109/VTS.2018.8368633

Cite this

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title = "Special session on reliability and vulnerability of neuromorphic computing systems",

abstract = "This is the summary of the special session on reliability and vulnerability of neuromorphic computing systems.",

keywords = "neuromorphic, reliability, vulnerability",

author = "Shimeng Yu and Chenchen Liu and Wujie Wen and Yiran Chen",

year = "2018",

month = may,

day = "29",

doi = "10.1109/VTS.2018.8368633",

language = "English (US)",

volume = "2018-April",

booktitle = "Proceedings - 2018 IEEE 36th VLSI Test Symposium, VTS 2018",

publisher = "IEEE Computer Society",

note = "36th IEEE VLSI Test Symposium, VTS 2018 ; Conference date: 22-04-2018 Through 25-04-2018",

}

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M3 - Conference contribution

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VL - 2018-April

BT - Proceedings - 2018 IEEE 36th VLSI Test Symposium, VTS 2018

PB - IEEE Computer Society

T2 - 36th IEEE VLSI Test Symposium, VTS 2018

Y2 - 22 April 2018 through 25 April 2018

ER -