Special session on reliability and vulnerability of neuromorphic computing systems

Shimeng Yu, Chenchen Liu, Wujie Wen, Yiran Chen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This is the summary of the special session on reliability and vulnerability of neuromorphic computing systems.

Original languageEnglish (US)
Title of host publicationProceedings - 2018 IEEE 36th VLSI Test Symposium, VTS 2018
PublisherIEEE Computer Society
Pages1
Number of pages1
ISBN (Electronic)9781538637746
DOIs
StatePublished - May 29 2018
Event36th IEEE VLSI Test Symposium, VTS 2018 - San Francisco, United States
Duration: Apr 22 2018Apr 25 2018

Publication series

NameProceedings of the IEEE VLSI Test Symposium
Volume2018-April

Other

Other36th IEEE VLSI Test Symposium, VTS 2018
Country/TerritoryUnited States
CitySan Francisco
Period4/22/184/25/18

Keywords

  • neuromorphic
  • reliability
  • vulnerability

ASJC Scopus subject areas

  • Computer Science Applications
  • Electrical and Electronic Engineering

Cite this