Special session on reliability and vulnerability of neuromorphic computing systems

Shimeng Yu, Chenchen Liu, Wujie Wen, Yiran Chen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This is the summary of the special session on reliability and vulnerability of neuromorphic computing systems.

Original languageEnglish (US)
Title of host publicationProceedings - 2018 IEEE 36th VLSI Test Symposium, VTS 2018
PublisherIEEE Computer Society
Number of pages1
Volume2018-April
ISBN (Electronic)9781538637746
DOIs
StatePublished - May 29 2018
Event36th IEEE VLSI Test Symposium, VTS 2018 - San Francisco, United States
Duration: Apr 22 2018Apr 25 2018

Other

Other36th IEEE VLSI Test Symposium, VTS 2018
CountryUnited States
CitySan Francisco
Period4/22/184/25/18

Keywords

  • neuromorphic
  • reliability
  • vulnerability

ASJC Scopus subject areas

  • Computer Science Applications
  • Electrical and Electronic Engineering

Cite this

Yu, S., Liu, C., Wen, W., & Chen, Y. (2018). Special session on reliability and vulnerability of neuromorphic computing systems. In Proceedings - 2018 IEEE 36th VLSI Test Symposium, VTS 2018 (Vol. 2018-April). IEEE Computer Society. https://doi.org/10.1109/VTS.2018.8368633