Spatial inhomogeneity of imprint and switching behavior in ferroelectric capacitors

A. Gruverman, B. J. Rodriguez, A. I. Kingon, R. J. Nemanich, J. S. Cross, M. Tsukada

Research output: Contribution to journalArticle

55 Scopus citations

Abstract

Spatial variation and switching behavior in ferroelectric capacitors were discussed. Piezoresponse force microscopy was used. Results showed that the inner regions of the capacitors show a strong tendency to negative imprint and the variations are a result of a complex combination of mechanical stress and electric-field effects.

Original languageEnglish (US)
Pages (from-to)3071-3073
Number of pages3
JournalApplied Physics Letters
Volume82
Issue number18
DOIs
StatePublished - May 5 2003

    Fingerprint

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Gruverman, A., Rodriguez, B. J., Kingon, A. I., Nemanich, R. J., Cross, J. S., & Tsukada, M. (2003). Spatial inhomogeneity of imprint and switching behavior in ferroelectric capacitors. Applied Physics Letters, 82(18), 3071-3073. https://doi.org/10.1063/1.1570942