Spatial variation and switching behavior in ferroelectric capacitors were discussed. Piezoresponse force microscopy was used. Results showed that the inner regions of the capacitors show a strong tendency to negative imprint and the variations are a result of a complex combination of mechanical stress and electric-field effects.
|Original language||English (US)|
|Number of pages||3|
|Journal||Applied Physics Letters|
|State||Published - May 5 2003|
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)