Spatial inhomogeneity of imprint and switching behavior in ferroelectric capacitors

A. Gruverman, B. J. Rodriguez, A. I. Kingon, R. J. Nemanich, J. S. Cross, M. Tsukada

Research output: Contribution to journalArticlepeer-review

59 Scopus citations

Abstract

Spatial variation and switching behavior in ferroelectric capacitors were discussed. Piezoresponse force microscopy was used. Results showed that the inner regions of the capacitors show a strong tendency to negative imprint and the variations are a result of a complex combination of mechanical stress and electric-field effects.

Original languageEnglish (US)
Pages (from-to)3071-3073
Number of pages3
JournalApplied Physics Letters
Volume82
Issue number18
DOIs
StatePublished - May 5 2003

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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