Spatial inhomogeneity of imprint and switching behavior in ferroelectric capacitors

A. Gruverman; B. J. Rodriguez; A. I. Kingon; R. J. Nemanich; J. S. Cross; M. Tsukada

doi:10.1063/1.1570942

Spatial inhomogeneity of imprint and switching behavior in ferroelectric capacitors

A. Gruverman, B. J. Rodriguez, A. I. Kingon, R. J. Nemanich, J. S. Cross, M. Tsukada

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65 Scopus citations

Abstract

Spatial variation and switching behavior in ferroelectric capacitors were discussed. Piezoresponse force microscopy was used. Results showed that the inner regions of the capacitors show a strong tendency to negative imprint and the variations are a result of a complex combination of mechanical stress and electric-field effects.

Original language	English (US)
Pages (from-to)	3071-3073
Number of pages	3
Journal	Applied Physics Letters
Volume	82
Issue number	18
DOIs	https://doi.org/10.1063/1.1570942
State	Published - May 5 2003
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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title = "Spatial inhomogeneity of imprint and switching behavior in ferroelectric capacitors",

abstract = "Spatial variation and switching behavior in ferroelectric capacitors were discussed. Piezoresponse force microscopy was used. Results showed that the inner regions of the capacitors show a strong tendency to negative imprint and the variations are a result of a complex combination of mechanical stress and electric-field effects.",

author = "A. Gruverman and Rodriguez, {B. J.} and Kingon, {A. I.} and Nemanich, {R. J.} and Cross, {J. S.} and M. Tsukada",

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AU - Gruverman, A.

AU - Rodriguez, B. J.

AU - Kingon, A. I.

AU - Nemanich, R. J.

AU - Cross, J. S.

AU - Tsukada, M.

PY - 2003/5/5

Y1 - 2003/5/5

N2 - Spatial variation and switching behavior in ferroelectric capacitors were discussed. Piezoresponse force microscopy was used. Results showed that the inner regions of the capacitors show a strong tendency to negative imprint and the variations are a result of a complex combination of mechanical stress and electric-field effects.

AB - Spatial variation and switching behavior in ferroelectric capacitors were discussed. Piezoresponse force microscopy was used. Results showed that the inner regions of the capacitors show a strong tendency to negative imprint and the variations are a result of a complex combination of mechanical stress and electric-field effects.

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JO - Applied Physics Letters

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Spatial inhomogeneity of imprint and switching behavior in ferroelectric capacitors

Abstract

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