Solving protein nanocrystals by cryo-EM: Multiple scattering artifacts

Ganesh Subramanian, Shibom Basu, Haiguang Liu, J. M. Zuo, John Spence

Research output: Contribution to journalArticle

Original languageEnglish (US)
Pages (from-to)1242-1243
Number of pages2
JournalMicroscopy and Microanalysis
Volume20
Issue number3
DOIs
StatePublished - Aug 1 2014

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Multiple scattering
Nanocrystals
artifacts
nanocrystals
proteins
Proteins
scattering

ASJC Scopus subject areas

  • Instrumentation

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Solving protein nanocrystals by cryo-EM : Multiple scattering artifacts. / Subramanian, Ganesh; Basu, Shibom; Liu, Haiguang; Zuo, J. M.; Spence, John.

In: Microscopy and Microanalysis, Vol. 20, No. 3, 01.08.2014, p. 1242-1243.

Research output: Contribution to journalArticle

Subramanian, Ganesh ; Basu, Shibom ; Liu, Haiguang ; Zuo, J. M. ; Spence, John. / Solving protein nanocrystals by cryo-EM : Multiple scattering artifacts. In: Microscopy and Microanalysis. 2014 ; Vol. 20, No. 3. pp. 1242-1243.
@article{ab23ec18d7454e109488dda0bead803e,
title = "Solving protein nanocrystals by cryo-EM: Multiple scattering artifacts",
author = "Ganesh Subramanian and Shibom Basu and Haiguang Liu and Zuo, {J. M.} and John Spence",
year = "2014",
month = "8",
day = "1",
doi = "10.1017/S1431927614007946",
language = "English (US)",
volume = "20",
pages = "1242--1243",
journal = "Microscopy and Microanalysis",
issn = "1431-9276",
publisher = "Cambridge University Press",
number = "3",

}

TY - JOUR

T1 - Solving protein nanocrystals by cryo-EM

T2 - Multiple scattering artifacts

AU - Subramanian, Ganesh

AU - Basu, Shibom

AU - Liu, Haiguang

AU - Zuo, J. M.

AU - Spence, John

PY - 2014/8/1

Y1 - 2014/8/1

UR - http://www.scopus.com/inward/record.url?scp=84927947506&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84927947506&partnerID=8YFLogxK

U2 - 10.1017/S1431927614007946

DO - 10.1017/S1431927614007946

M3 - Article

AN - SCOPUS:84927947506

VL - 20

SP - 1242

EP - 1243

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

SN - 1431-9276

IS - 3

ER -