Engineering & Materials Science
Particle detectors
95%
Charged particles
81%
Carrier concentration
80%
Sol-gels
74%
Doping (additives)
62%
Thin film transistors
48%
Ellipsometry
31%
Pulsed laser deposition
29%
Electron microscopy
24%
Sputtering
24%
Atomic force microscopy
23%
Optical properties
23%
Spectroscopy
21%
Film thickness
20%
Diffraction
20%
Thin films
17%
Diodes
17%
X rays
17%
Capacitors
14%
Microstructure
12%
Metals
12%
Sensors
9%
Mathematics
Sol-gel
100%
Zinc Oxide
98%
Detector
67%
Resistivity
63%
Thin-film Transistor
46%
Pulsed Laser Deposition
24%
Atomic Force Microscopy
21%
Ellipsometry
20%
Sputtering
20%
X-ray Diffraction
17%
Electron Microscopy
17%
Optical Properties
17%
Diode
15%
Capacitor
15%
Precursor
15%
Spectroscopy
14%
Thin Films
14%
Sensor
13%
Microstructure
12%
Metals
12%
Characterization
5%
Physics & Astronomy
radiation counters
66%
charged particles
48%
gels
44%
electrical resistivity
35%
transistors
22%
thin films
21%
p-i-n diodes
18%
ellipsometry
13%
pulsed laser deposition
13%
capacitors
12%
x ray diffraction
12%
electron microscopy
12%
film thickness
11%
sputtering
11%
atomic force microscopy
10%
optical properties
9%
sensors
8%
microstructure
8%
characterization
7%
spectroscopy
7%
metals
7%
Chemical Compounds
Sol
52%
Gel
35%
Liquid Film
27%
Pulsed Laser Deposition
18%
Ellipsometry
15%
Sputtering
15%
Capacitor
14%
Polycrystalline Solid
12%
Electron Microscopy
12%
Atomic Force Microscopy
11%
Compound Mobility
10%
Optical Property
10%
Microstructure
9%
Spectroscopy
9%
UV/VIS Spectroscopy
8%