Abstract

The next step to confirm the MESFET's ability to handle extreme environments will be testing the buck regulator in the presence of radiation. These measurements will be completed in the coming month and the results presented at the conference. Eventually the goal will be to integrate the MESFET with the feedback circuitry and to more carefully design the buck regulator board, choosing components that maximize the efficiency and reduce the parasitics. Already extensive work has been done to reduce the layout size of the MESFET in Fig. 2 by over 50%.

Original languageEnglish (US)
Title of host publicationIEEE International SOI Conference, SOI 2011
DOIs
StatePublished - Dec 20 2011
Event2011 IEEE International SOI Conference, SOI 2011 - Tempe, AZ, United States
Duration: Oct 3 2011Oct 6 2011

Publication series

NameProceedings - IEEE International SOI Conference
ISSN (Print)1078-621X

Other

Other2011 IEEE International SOI Conference, SOI 2011
CountryUnited States
CityTempe, AZ
Period10/3/1110/6/11

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ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Cite this

Lepkowski, W., Goryll, M., Wilk, S. J., Zhang, Y., Sochacki, J., & Thornton, T. (2011). SOI MESFETs for extreme environment buck regulators. In IEEE International SOI Conference, SOI 2011 [6081696] (Proceedings - IEEE International SOI Conference). https://doi.org/10.1109/SOI.2011.6081696