Soft error reduction in FPGAs for digital I&C in nuclear power plants

Rahul Puri, Keith Holbert, Lawrence T. Clark

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

Field-programmable gate arrays (FPGAs), due to their advantages in configurability, upgrading and data processing, have been proposed for digital instrumentation and control in nuclear power plants. However, like other integrated circuits, memory-based FPGAs are susceptible to single event effects (SEEs) in the logic and in the memories that program their logic configuration. Downscaling of CMOS technology has led to reduction in load capacitance and drive, which has further increased the problem of SEEs, including multiple bit upsets. Single event upsets (SEUs), a form of SEEs, is a change in state of memory cells that can be caused by terrestrial cosmic neutrons. The aim of our research is to develop fail-proof schemes to curb the effect of SEUs due to neutrons in FPGAs.

Original languageEnglish (US)
Title of host publicationInternational Congress on Advances in Nuclear Power Plants 2010, ICAPP 2010
Pages808-816
Number of pages9
StatePublished - Sep 7 2010
EventInternational Congress on Advances in Nuclear Power Plants 2010, ICAPP 2010 - San Diego, CA, United States
Duration: Jun 13 2010Jun 17 2010

Publication series

NameInternational Congress on Advances in Nuclear Power Plants 2010, ICAPP 2010
Volume2

Other

OtherInternational Congress on Advances in Nuclear Power Plants 2010, ICAPP 2010
CountryUnited States
CitySan Diego, CA
Period6/13/106/17/10

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ASJC Scopus subject areas

  • Energy Engineering and Power Technology
  • Nuclear Energy and Engineering

Cite this

Puri, R., Holbert, K., & Clark, L. T. (2010). Soft error reduction in FPGAs for digital I&C in nuclear power plants. In International Congress on Advances in Nuclear Power Plants 2010, ICAPP 2010 (pp. 808-816). (International Congress on Advances in Nuclear Power Plants 2010, ICAPP 2010; Vol. 2).