Singularities at solder joint Interfaces and their effects on Fracture models

Dhruv Bhate, D. Chan, G. Subbarayan, L. Nguyen, J. Zhao, D. Edwards

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

In this study, we focus on investigating the nature of the stress and strain behavior in solder joints and their effect on the hybrid damage modeling approach, which is inspired by cohesive zone modeling and Weibull functions [Towashiraporn, et al., 2005, "A Hybrid Model for Computationally Efficient Fatigue Fracture Simulations at Microelectronic Assembly Interfaces," Int. J. Solids Struct., 42 (15), pp. 4468-4483]. We review well understood principles in elastic-plastic fracture mechanics and more recent work in cohesive zone modeling, that address the nature of the singular solutions at the crack tip and provide insight when dealing with the more complex problem of solder joint fracture. Using three-dimensional finite element analysis of a chip scale package, we systematically examine the stress-strain behavior at the edge of the solder joint along the interface. The singular nature of the behavior manifests itself as mesh dependence of the predicted crack front shape and the cycles to failure. We discuss the conditions under which the predicted crack growth rate is of reasonable accuracy by incorporating a characteristic length measure. We validate predictions made by the hybrid damage modeling approach against a companion experimental study in which crack growth was tracked in packages subjected to accelerated thermal cycling.

Original languageEnglish (US)
Pages (from-to)210071-2100710
Number of pages1890640
JournalJournal of Electronic Packaging, Transactions of the ASME
Volume132
Issue number2
DOIs
StatePublished - Jun 1 2010
Externally publishedYes

Fingerprint

Soldering alloys
Crack propagation
Chip scale packages
Thermal cycling
Fracture mechanics
Microelectronics
Crack tips
Fatigue of materials
Plastics
Cracks
Finite element method

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials
  • Computer Science Applications
  • Electrical and Electronic Engineering

Cite this

Singularities at solder joint Interfaces and their effects on Fracture models. / Bhate, Dhruv; Chan, D.; Subbarayan, G.; Nguyen, L.; Zhao, J.; Edwards, D.

In: Journal of Electronic Packaging, Transactions of the ASME, Vol. 132, No. 2, 01.06.2010, p. 210071-2100710.

Research output: Contribution to journalArticle

Bhate, Dhruv ; Chan, D. ; Subbarayan, G. ; Nguyen, L. ; Zhao, J. ; Edwards, D. / Singularities at solder joint Interfaces and their effects on Fracture models. In: Journal of Electronic Packaging, Transactions of the ASME. 2010 ; Vol. 132, No. 2. pp. 210071-2100710.
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