Single-shot structural analysis by high-energy X-ray diffraction using an ultrashort all-optical source

R. Rakowski, G. Golovin, J. O'Neal, J. Zhang, P. Zhang, B. Zhao, M. D. Wilson, M. C. Veale, P. Seller, S. Chen, S. Banerjee, D. Umstadter, M. Fuchs

Research output: Contribution to journal › Article › peer-review