Single-measurement diagnostic test method for parametric faults of I/Q modulating RF transceivers

Erdem S. Erdogan, Suie Ozev

Research output: Chapter in Book/Report/Conference proceedingConference contribution

17 Scopus citations

Abstract

This paper presents a loop-back method for quadrature modulation transceiver circuits to diagnose parametric faults of the system, such as I/Q mismatch, baseband/RF time skew, and DC offsets. The proposed method is capable of separating the transmitter parameters from the receiver parameters in a single measurement. Digital baseband signals are used as test input and the received I/Q baseband signals are analyzed for parameter extraction. Experimental results show that the test method has 1.5% RMS error performance in the presence of thermal noise and unknown delays caused by the loop-back connection. The test technique can easily be implemented on a digital tester. Either on-chip baseband data converters or load board data converters (for transceiver circuits without digital output) can be used for interfacing the transceiver circuit under test.

Original languageEnglish (US)
Title of host publicationProceedings - 26th IEEE VLSI Test Symposium, VTS08
Pages209-214
Number of pages6
DOIs
StatePublished - Sep 16 2008
Externally publishedYes
Event26th IEEE VLSI Test Symposium, VTS08 - San Diego, CA, United States
Duration: Apr 27 2008May 1 2008

Publication series

NameProceedings of the IEEE VLSI Test Symposium

Other

Other26th IEEE VLSI Test Symposium, VTS08
CountryUnited States
CitySan Diego, CA
Period4/27/085/1/08

ASJC Scopus subject areas

  • Computer Science Applications
  • Electrical and Electronic Engineering

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  • Cite this

    Erdogan, E. S., & Ozev, S. (2008). Single-measurement diagnostic test method for parametric faults of I/Q modulating RF transceivers. In Proceedings - 26th IEEE VLSI Test Symposium, VTS08 (pp. 209-214). [4511724] (Proceedings of the IEEE VLSI Test Symposium). https://doi.org/10.1109/VTS.2008.39