@inproceedings{ed32c2c299294075ae0b23823a44bb85,
title = "Single-measurement diagnostic test method for parametric faults of I/Q modulating RF transceivers",
abstract = "This paper presents a loop-back method for quadrature modulation transceiver circuits to diagnose parametric faults of the system, such as I/Q mismatch, baseband/RF time skew, and DC offsets. The proposed method is capable of separating the transmitter parameters from the receiver parameters in a single measurement. Digital baseband signals are used as test input and the received I/Q baseband signals are analyzed for parameter extraction. Experimental results show that the test method has 1.5% RMS error performance in the presence of thermal noise and unknown delays caused by the loop-back connection. The test technique can easily be implemented on a digital tester. Either on-chip baseband data converters or load board data converters (for transceiver circuits without digital output) can be used for interfacing the transceiver circuit under test.",
author = "Erdogan, {Erdem S.} and Sule Ozev",
year = "2008",
doi = "10.1109/VTS.2008.39",
language = "English (US)",
isbn = "9780769531236",
series = "Proceedings of the IEEE VLSI Test Symposium",
publisher = "IEEE Computer Society",
pages = "209--214",
booktitle = "Proceedings - 26th IEEE VLSI Test Symposium, VTS08",
note = "26th IEEE VLSI Test Symposium, VTS08 ; Conference date: 27-04-2008 Through 01-05-2008",
}