Single-measurement diagnostic test method for parametric faults of I/Q modulating RF transceivers

Erdem S. Erdogan, Sule Ozev

Research output: Chapter in Book/Report/Conference proceedingConference contribution

17 Citations (Scopus)

Abstract

This paper presents a loop-back method for quadrature modulation transceiver circuits to diagnose parametric faults of the system, such as I/Q mismatch, baseband/RF time skew, and DC offsets. The proposed method is capable of separating the transmitter parameters from the receiver parameters in a single measurement. Digital baseband signals are used as test input and the received I/Q baseband signals are analyzed for parameter extraction. Experimental results show that the test method has 1.5% RMS error performance in the presence of thermal noise and unknown delays caused by the loop-back connection. The test technique can easily be implemented on a digital tester. Either on-chip baseband data converters or load board data converters (for transceiver circuits without digital output) can be used for interfacing the transceiver circuit under test.

Original languageEnglish (US)
Title of host publicationProceedings of the IEEE VLSI Test Symposium
Pages209-214
Number of pages6
DOIs
StatePublished - 2008
Externally publishedYes
Event26th IEEE VLSI Test Symposium, VTS08 - San Diego, CA, United States
Duration: Apr 27 2008May 1 2008

Other

Other26th IEEE VLSI Test Symposium, VTS08
CountryUnited States
CitySan Diego, CA
Period4/27/085/1/08

Fingerprint

Transceivers
Parameter extraction
Thermal noise
Networks (circuits)
Digital circuits
Transmitters
Modulation

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Erdogan, E. S., & Ozev, S. (2008). Single-measurement diagnostic test method for parametric faults of I/Q modulating RF transceivers. In Proceedings of the IEEE VLSI Test Symposium (pp. 209-214). [4511724] https://doi.org/10.1109/VTS.2008.39

Single-measurement diagnostic test method for parametric faults of I/Q modulating RF transceivers. / Erdogan, Erdem S.; Ozev, Sule.

Proceedings of the IEEE VLSI Test Symposium. 2008. p. 209-214 4511724.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Erdogan, ES & Ozev, S 2008, Single-measurement diagnostic test method for parametric faults of I/Q modulating RF transceivers. in Proceedings of the IEEE VLSI Test Symposium., 4511724, pp. 209-214, 26th IEEE VLSI Test Symposium, VTS08, San Diego, CA, United States, 4/27/08. https://doi.org/10.1109/VTS.2008.39
Erdogan, Erdem S. ; Ozev, Sule. / Single-measurement diagnostic test method for parametric faults of I/Q modulating RF transceivers. Proceedings of the IEEE VLSI Test Symposium. 2008. pp. 209-214
@inproceedings{ed32c2c299294075ae0b23823a44bb85,
title = "Single-measurement diagnostic test method for parametric faults of I/Q modulating RF transceivers",
abstract = "This paper presents a loop-back method for quadrature modulation transceiver circuits to diagnose parametric faults of the system, such as I/Q mismatch, baseband/RF time skew, and DC offsets. The proposed method is capable of separating the transmitter parameters from the receiver parameters in a single measurement. Digital baseband signals are used as test input and the received I/Q baseband signals are analyzed for parameter extraction. Experimental results show that the test method has 1.5{\%} RMS error performance in the presence of thermal noise and unknown delays caused by the loop-back connection. The test technique can easily be implemented on a digital tester. Either on-chip baseband data converters or load board data converters (for transceiver circuits without digital output) can be used for interfacing the transceiver circuit under test.",
author = "Erdogan, {Erdem S.} and Sule Ozev",
year = "2008",
doi = "10.1109/VTS.2008.39",
language = "English (US)",
isbn = "9780769531236",
pages = "209--214",
booktitle = "Proceedings of the IEEE VLSI Test Symposium",

}

TY - GEN

T1 - Single-measurement diagnostic test method for parametric faults of I/Q modulating RF transceivers

AU - Erdogan, Erdem S.

AU - Ozev, Sule

PY - 2008

Y1 - 2008

N2 - This paper presents a loop-back method for quadrature modulation transceiver circuits to diagnose parametric faults of the system, such as I/Q mismatch, baseband/RF time skew, and DC offsets. The proposed method is capable of separating the transmitter parameters from the receiver parameters in a single measurement. Digital baseband signals are used as test input and the received I/Q baseband signals are analyzed for parameter extraction. Experimental results show that the test method has 1.5% RMS error performance in the presence of thermal noise and unknown delays caused by the loop-back connection. The test technique can easily be implemented on a digital tester. Either on-chip baseband data converters or load board data converters (for transceiver circuits without digital output) can be used for interfacing the transceiver circuit under test.

AB - This paper presents a loop-back method for quadrature modulation transceiver circuits to diagnose parametric faults of the system, such as I/Q mismatch, baseband/RF time skew, and DC offsets. The proposed method is capable of separating the transmitter parameters from the receiver parameters in a single measurement. Digital baseband signals are used as test input and the received I/Q baseband signals are analyzed for parameter extraction. Experimental results show that the test method has 1.5% RMS error performance in the presence of thermal noise and unknown delays caused by the loop-back connection. The test technique can easily be implemented on a digital tester. Either on-chip baseband data converters or load board data converters (for transceiver circuits without digital output) can be used for interfacing the transceiver circuit under test.

UR - http://www.scopus.com/inward/record.url?scp=51449119665&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=51449119665&partnerID=8YFLogxK

U2 - 10.1109/VTS.2008.39

DO - 10.1109/VTS.2008.39

M3 - Conference contribution

AN - SCOPUS:51449119665

SN - 9780769531236

SP - 209

EP - 214

BT - Proceedings of the IEEE VLSI Test Symposium

ER -