Simulations for surface profile imaging

Ping Lu, David Smith

Research output: Contribution to journalArticle

6 Scopus citations

Abstract

The feasibility of quantifying surface structures using the profile imaging technique in high-resolution electron microscopy has been considered using theoretical multi-slice simulations. The possibilities for observing surfaces with missing or additional atoms, or with reconstruction, have been investigated in detail, with reference to particular oxides (UO2, TbO2) and compound semiconductors (CdTe, GaAs). The influence of such factors as incident beam misalignment, accelerating voltage, objective lens defocus and crystal thickness on the apparent surface relaxation were also considered, together with the possibility of eliminating any artefacts by using a focal series restoration.

Original languageEnglish (US)
Pages (from-to)265-277
Number of pages13
JournalUltramicroscopy
Volume25
Issue number4
DOIs
StatePublished - 1988

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

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