Abstract
Pseudomorphic delta-doped ultrasubmicrometer-gate high-electron mobility transistors have been modeled using a full-band cellular Monte Carlo simulator. Reasonable agreement between experimental and numerical results is obtained for a 70-nm gate length. We discuss the scaling of this device to shorter gate lengths and the role played by various dimensions in the structure. Devices with 20-nm gate lengths should produce fTs above 1.5 THz without difficulty. This paper demonstrates the power of particle-based simulation tools in capturing the relevant physics responsible for device operation and key to performance optimization.
Original language | English (US) |
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Pages (from-to) | 2327-2338 |
Number of pages | 12 |
Journal | IEEE Transactions on Electron Devices |
Volume | 54 |
Issue number | 9 |
DOIs | |
State | Published - Sep 2007 |
Keywords
- Millimeter-wave transistors
- Monte Carlo methods
- Pseudomorphic high-electron mobility transistors (p-HEMTs)
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering