Simulation of Transistor-Level Radiation Effects on System-Level Performance Parameters

A. F. Witulski; N. Mahadevan; J. Kauppila; G. Karsai; A. Sternberg; R. D. Schrimpf; R. A. Reed; P. Adell; H. Schone; A. Daniel; A. Privat; H. Barnaby

doi:10.1109/TNS.2019.2922903

Simulation of Transistor-Level Radiation Effects on System-Level Performance Parameters

A. F. Witulski, N. Mahadevan, J. Kauppila, G. Karsai, A. Sternberg, R. D. Schrimpf, R. A. Reed, P. Adell, H. Schone, A. Daniel, A. Privat, H. Barnaby

Engineering, Ira A. Fulton Schools of (IAFSE)

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

Abstract

A simulation paradigm is proposed to examine the effects of transistor-level degradation produced by total ionizing dose (TID) on top-level system performance parameters. The approach is demonstrated on a command and data handling (CDH) board for deep-space CubeSats. Simulation and postirradiation measurements of a temperature control loop show that TID degradation changes temperature regulation significantly.

Original language	English (US)
Article number	8736527
Pages (from-to)	1634-1641
Number of pages	8
Journal	IEEE Transactions on Nuclear Science
Volume	66
Issue number	7
DOIs	https://doi.org/10.1109/TNS.2019.2922903
State	Published - Jul 2019

Keywords

Cosimulation
Questa
SystemC
Verilog-Analog Mixed Signal (Verilog-AMS)
functional models
system modeling
total ionizing dose (TID)
very high speed integrated circuit hardware description language (VHDL)

ASJC Scopus subject areas

Nuclear and High Energy Physics
Nuclear Energy and Engineering
Electrical and Electronic Engineering

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10.1109/TNS.2019.2922903

Cite this

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title = "Simulation of Transistor-Level Radiation Effects on System-Level Performance Parameters",

abstract = "A simulation paradigm is proposed to examine the effects of transistor-level degradation produced by total ionizing dose (TID) on top-level system performance parameters. The approach is demonstrated on a command and data handling (CDH) board for deep-space CubeSats. Simulation and postirradiation measurements of a temperature control loop show that TID degradation changes temperature regulation significantly.",

keywords = "Cosimulation, Questa, SystemC, Verilog-Analog Mixed Signal (Verilog-AMS), functional models, system modeling, total ionizing dose (TID), very high speed integrated circuit hardware description language (VHDL)",

author = "Witulski, {A. F.} and N. Mahadevan and J. Kauppila and G. Karsai and A. Sternberg and Schrimpf, {R. D.} and Reed, {R. A.} and P. Adell and H. Schone and A. Daniel and A. Privat and H. Barnaby",

note = "Funding Information: Manuscript received May 17, 2019; revised June 6, 2019; accepted June 7, 2019. Date of publication June 13, 2019; date of current version July 16, 2019. This work was supported by the NASA Jet Propulsion Laboratory (JPL) under Subcontract 1568812 and Subcontract 1592616. Publisher Copyright: {\textcopyright} 1963-2012 IEEE.",

year = "2019",

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doi = "10.1109/TNS.2019.2922903",

language = "English (US)",

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journal = "IEEE Transactions on Nuclear Science",

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AU - Mahadevan, N.

AU - Kauppila, J.

AU - Karsai, G.

AU - Sternberg, A.

AU - Schrimpf, R. D.

AU - Reed, R. A.

AU - Adell, P.

AU - Schone, H.

AU - Daniel, A.

AU - Privat, A.

AU - Barnaby, H.

N1 - Funding Information: Manuscript received May 17, 2019; revised June 6, 2019; accepted June 7, 2019. Date of publication June 13, 2019; date of current version July 16, 2019. This work was supported by the NASA Jet Propulsion Laboratory (JPL) under Subcontract 1568812 and Subcontract 1592616. Publisher Copyright: © 1963-2012 IEEE.

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KW - Cosimulation

KW - Questa

KW - SystemC

KW - Verilog-Analog Mixed Signal (Verilog-AMS)

KW - functional models

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KW - very high speed integrated circuit hardware description language (VHDL)

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Simulation of Transistor-Level Radiation Effects on System-Level Performance Parameters

Abstract

Keywords

ASJC Scopus subject areas

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