Simulation of random telegraph noise with 2-stage equivalent circuit

Yun Ye, Chi Chao Wang, Yu Cao

Research output: Chapter in Book/Report/Conference proceedingConference contribution

19 Citations (Scopus)

Abstract

With the continuous reduction of CMOS device dimension, the importance of Random Telegraph Noise (RTN) keeps growing. To determine its impact on circuit performance and optimize the design, it is essential to physically model RTN effect and embed it into the standard simulation environment. In this paper, a new simulation method of time domain RTN effect is proposed to benchmark important digital circuits: (1) A two-stage L-shaped circuit is proposed to generate RTN signal by integrating a white noise source. An L-shaped circuit is a RC filter connected with an ideal comparator, where RC values are calibrated with the physical property of RTN; (2) This sub-circuit is fully compatible with SPICE, enabling the time domain analysis in nanometer scale digital design; (3) The importance of discrete RTN is demonstrated on a 32nm SRAM design and a 22nm low power ring oscillator (RO), using the proposed method. As compared to traditional 1/f noise, the impact of RTN is more significant under low voltages, leading to tremendous differences in the prediction of Vccmin and failure probability in SRAM, as well as jitter noise in RO.

Original languageEnglish (US)
Title of host publicationIEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
Pages709-713
Number of pages5
DOIs
StatePublished - 2010
Event2010 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2010 - San Jose, CA, United States
Duration: Nov 7 2010Nov 11 2010

Other

Other2010 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2010
CountryUnited States
CitySan Jose, CA
Period11/7/1011/11/10

Fingerprint

Telegraph
Equivalent circuits
Networks (circuits)
Static random access storage
Time domain analysis
Digital circuits
SPICE
White noise
Jitter
Physical properties
Electric potential

Keywords

  • Random telegraph noise
  • Ring oscillator
  • Spice simulation
  • SRAM

ASJC Scopus subject areas

  • Computer Graphics and Computer-Aided Design
  • Computer Science Applications
  • Software

Cite this

Ye, Y., Wang, C. C., & Cao, Y. (2010). Simulation of random telegraph noise with 2-stage equivalent circuit. In IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD (pp. 709-713). [5654254] https://doi.org/10.1109/ICCAD.2010.5654254

Simulation of random telegraph noise with 2-stage equivalent circuit. / Ye, Yun; Wang, Chi Chao; Cao, Yu.

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD. 2010. p. 709-713 5654254.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Ye, Y, Wang, CC & Cao, Y 2010, Simulation of random telegraph noise with 2-stage equivalent circuit. in IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD., 5654254, pp. 709-713, 2010 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2010, San Jose, CA, United States, 11/7/10. https://doi.org/10.1109/ICCAD.2010.5654254
Ye Y, Wang CC, Cao Y. Simulation of random telegraph noise with 2-stage equivalent circuit. In IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD. 2010. p. 709-713. 5654254 https://doi.org/10.1109/ICCAD.2010.5654254
Ye, Yun ; Wang, Chi Chao ; Cao, Yu. / Simulation of random telegraph noise with 2-stage equivalent circuit. IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD. 2010. pp. 709-713
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