Simulation of electron diffraction patterns from partially ordered layer lattices

Michael Treacy, J. M. Newsam, M. W. Deem

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

By extending the theoretical treatments of Cowley and Hendricks and Teller, we have shown that the diffracted wave functions from successive slabs in crystals containing planar defects are related by simple recurrence equations. Recurrence equations greatly simplify the simulation of diffraction from coherently faulted crystals. Selected-area electron diffraction patterns for zeolite beta are simulated and compared with experimental data. Results are consistent with previous observations, made by structure imaging and powder X-ray diffraction, that zeolite beta is a highly disordered intergrowth of two unfaulted end-member structures, with a probability of a stacking fault being close to 50%. The quantitative accuracy of the recursion model of electron diffraction is limited by dynamical scattering effects.

Original languageEnglish (US)
Pages (from-to)512-522
Number of pages11
JournalUltramicroscopy
Volume52
Issue number3-4
DOIs
StatePublished - 1993
Externally publishedYes

Fingerprint

Zeolites
Electron diffraction
Diffraction patterns
diffraction patterns
electron diffraction
Crystals
Stacking faults
Wave functions
diffraction
crystal defects
X ray powder diffraction
crystals
slabs
simulation
Diffraction
wave functions
Scattering
Imaging techniques
Defects
defects

ASJC Scopus subject areas

  • Materials Science(all)
  • Instrumentation

Cite this

Simulation of electron diffraction patterns from partially ordered layer lattices. / Treacy, Michael; Newsam, J. M.; Deem, M. W.

In: Ultramicroscopy, Vol. 52, No. 3-4, 1993, p. 512-522.

Research output: Contribution to journalArticle

Treacy, Michael ; Newsam, J. M. ; Deem, M. W. / Simulation of electron diffraction patterns from partially ordered layer lattices. In: Ultramicroscopy. 1993 ; Vol. 52, No. 3-4. pp. 512-522.
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