Simulation of decoherence in fluctuation electron microscopy

A. Rezikyan, Z. Jibben, B. Rock, G. Zhao, Michael Treacy

Research output: Contribution to journalArticle

1 Citation (Scopus)
Original languageEnglish (US)
Pages (from-to)150-151
Number of pages2
JournalMicroscopy and Microanalysis
Volume20
Issue number3
DOIs
StatePublished - Aug 1 2014

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Electron microscopy
electron microscopy
simulation

ASJC Scopus subject areas

  • Instrumentation

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Simulation of decoherence in fluctuation electron microscopy. / Rezikyan, A.; Jibben, Z.; Rock, B.; Zhao, G.; Treacy, Michael.

In: Microscopy and Microanalysis, Vol. 20, No. 3, 01.08.2014, p. 150-151.

Research output: Contribution to journalArticle

Rezikyan, A. ; Jibben, Z. ; Rock, B. ; Zhao, G. ; Treacy, Michael. / Simulation of decoherence in fluctuation electron microscopy. In: Microscopy and Microanalysis. 2014 ; Vol. 20, No. 3. pp. 150-151.
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