Simulation of decoherence in fluctuation electron microscopy

A. Rezikyan; Z. Jibben; B. Rock; G. Zhao; M. M.J. Treacy

doi:10.1017/S1431927614002475

Simulation of decoherence in fluctuation electron microscopy

A. Rezikyan, Z. Jibben, B. Rock, G. Zhao, M. M.J. Treacy

Physics

Research output: Contribution to journal › Conference article › peer-review

1 Scopus citations

Original language	English (US)
Pages (from-to)	150-151
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	20
Issue number	3
DOIs	https://doi.org/10.1017/S1431927614002475
State	Published - Aug 1 2014
Event	Microscopy and Microanalysis 2014, M and M 2014 - Hartford, United States Duration: Aug 3 2014 → Aug 7 2014

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Instrumentation

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10.1017/S1431927614002475

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@article{01671b692f294fb7ae2f66b44d11207d,

title = "Simulation of decoherence in fluctuation electron microscopy",

author = "A. Rezikyan and Z. Jibben and B. Rock and G. Zhao and Treacy, {M. M.J.}",

year = "2014",

month = aug,

day = "1",

doi = "10.1017/S1431927614002475",

language = "English (US)",

volume = "20",

pages = "150--151",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "3",

note = "Microscopy and Microanalysis 2014, M and M 2014 ; Conference date: 03-08-2014 Through 07-08-2014",

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TY - JOUR

T1 - Simulation of decoherence in fluctuation electron microscopy

AU - Rezikyan, A.

AU - Jibben, Z.

AU - Rock, B.

AU - Zhao, G.

AU - Treacy, M. M.J.

PY - 2014/8/1

Y1 - 2014/8/1

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U2 - 10.1017/S1431927614002475

DO - 10.1017/S1431927614002475

M3 - Conference article

AN - SCOPUS:84927919104

SN - 1431-9276

VL - 20

SP - 150

EP - 151

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 3

T2 - Microscopy and Microanalysis 2014, M and M 2014

Y2 - 3 August 2014 through 7 August 2014

ER -

Simulation of decoherence in fluctuation electron microscopy

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