Simulation of damage-features in complex joint using guided waves

Sunilkumar Soni, Sourav Banerjee, Santanu Das, Aditi Chattopadhyay

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

This paper presents the use of guided wave concept in localizing small cracks in complex lug joint structures. A lug joint is a one of the several 'hotspots' in an aerospace structure which experiences fatigue damage. Several fatigue tests on lug joint samples prepared from 0.25" plate of Aluminum (Al) 2024 T35l indicated a distinct failure pattern. All samples failed at the shoulders. Different notch sizes are introduced at the shoulders and both virtual and real active health monitoring with piezoelectric transducers is performed. Simulations of the real time experiment are carried out using Finite Element (FE) analysis. Similar crack geometry and piezoelectric transducer orientation are considered both in experiment and in simulation. Results presented illustrate the use of guided waves in interrogating damage in lug joints. A comparison of sensor signals has been made between experimental and simulated signals which show good correlation. The frequency transform on the sensor signal data yield useful information for characterizing damage. Further, sensitivity studies are performed. The sensitivity study information offers potential application in reducing the computational cost for any defect localization technique by reducing redundant sensors. This information is a key to optimal sensor placement for damage detection in structural health monitoring (SHM).

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Volume6926
DOIs
StatePublished - 2008
EventModeling, Signal Processing, and Control for Smart Structures 2008 - San Diego, CA, United States
Duration: Mar 10 2008Mar 12 2008

Other

OtherModeling, Signal Processing, and Control for Smart Structures 2008
CountryUnited States
CitySan Diego, CA
Period3/10/083/12/08

Fingerprint

lugs
Guided electromagnetic wave propagation
damage
Piezoelectric transducers
piezoelectric transducers
sensors
Sensors
shoulders
crack geometry
simulation
Cracks
fatigue tests
structural health monitoring
Damage detection
sensitivity
Structural health monitoring
Fatigue damage
notches
health
transducers

Keywords

  • Complex geometry
  • Damage interrogation
  • Data pruning technique
  • Fatigue cracks
  • Finite element analysis
  • Guided wave
  • Piezoelectric
  • Sensor sensitivity
  • Structural health monitoring

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Soni, S., Banerjee, S., Das, S., & Chattopadhyay, A. (2008). Simulation of damage-features in complex joint using guided waves. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 6926). [69260O] https://doi.org/10.1117/12.776468

Simulation of damage-features in complex joint using guided waves. / Soni, Sunilkumar; Banerjee, Sourav; Das, Santanu; Chattopadhyay, Aditi.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 6926 2008. 69260O.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Soni, S, Banerjee, S, Das, S & Chattopadhyay, A 2008, Simulation of damage-features in complex joint using guided waves. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 6926, 69260O, Modeling, Signal Processing, and Control for Smart Structures 2008, San Diego, CA, United States, 3/10/08. https://doi.org/10.1117/12.776468
Soni S, Banerjee S, Das S, Chattopadhyay A. Simulation of damage-features in complex joint using guided waves. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 6926. 2008. 69260O https://doi.org/10.1117/12.776468
Soni, Sunilkumar ; Banerjee, Sourav ; Das, Santanu ; Chattopadhyay, Aditi. / Simulation of damage-features in complex joint using guided waves. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 6926 2008.
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