Abstract
In this paper, we present a set of models that describe the principal components of the Horizontal Ribbon Growth process - mainly, the interaction between fluid flow and heat transfer, the crystallization dynamics, and the effect of impurities on the morphology of the interface. Fluid-flow and heat-transfer models show the relationship between the pulling rate and the thickness of the silicon film. A crystallization model is developed to find the concentration distribution of impurities - aluminum in this case - in the melt and in the ribbon. We find that, because of low growth velocities, there is no formation of a solute-enriched boundary layer and that a 50-fold reduction of aluminum impurities can be expected. Finally, we use the Mullins-Sekerka stability theory to show that aluminum impurities at the proposed levels do not destabilize the interface upon applied perturbations.
Original language | English (US) |
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Pages (from-to) | 3239-3246 |
Number of pages | 8 |
Journal | Industrial and Engineering Chemistry Research |
Volume | 52 |
Issue number | 9 |
DOIs | |
State | Published - Mar 6 2013 |
Externally published | Yes |
ASJC Scopus subject areas
- General Chemistry
- General Chemical Engineering
- Industrial and Manufacturing Engineering