SILICON-SAPPHIRE INTERFACE: A HIGH RESOLUTION ELECTRON MICROSCOPY STUDY.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations
Original languageEnglish (US)
Title of host publicationMat Res Soc Symp Proc
Pages285-290
Number of pages6
Publication statusPublished - 1981
Externally publishedYes

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ASJC Scopus subject areas

  • Engineering(all)

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