Silicon Nitride Barrier Layers Mitigate Minority-Carrier Lifetime Degradation in Silicon Wafers during Simulated MBE Growth of III-V Layers

Chaomin Zhang, Laura Ding, Mathieu Boccard, Tine U. Narland, Nikolai Faleev, Stuart Bowden, Mariana Bertoni, Christiana Honsberg, Zachary Holman

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