Silicon Mirrors for High-Intensity X-Ray Pump and Probe Experiments

Tom Pardini, Sébastien Boutet, Joseph Bradley, Tilo Döppner, Luke B. Fletcher, Dennis F. Gardner, Randy M. Hill, Mark S. Hunter, Jacek Krzywinski, Marc Messerschmidt, Arthur E. Pak, Florian Quirin, Klaus Sokolowski-Tinten, Garth J. Williams, Stefan P. Hau-Riege

Research output: Contribution to journalArticle

2 Scopus citations

Abstract

An all-x-ray pump and probe capability is highly desired for the free-electron laser community. A possible implementation involves the use of an x-ray mirror downstream of the sample to backreflect the pump beam onto itself. We expose silicon single crystals, a candidate for this hard-x-ray mirror, to the hard-x-ray beam of the Linac Coherent Light Source (SLAC National Acceleration Laboratory) to assess its suitability. We find that silicon is an appropriate mirror material, but its reflectivity at high x-ray fluences is somewhat unpredictable. We attribute this behavior to x-ray-induced local damage in the mirror, which we have characterized post mortem via microdiffraction, scanning electron microscopy, and Raman spectroscopy. We demonstrate a strategy to reduce local damage by using a structured silicon-based mirror. Preliminary results suggest that the latter yields reproducible Bragg reflectivity at high x-ray fluences, promising a path forward for silicon single crystals as x-ray backreflectors.

Original languageEnglish (US)
Article number044007
JournalPhysical Review Applied
Volume1
Issue number4
DOIs
StatePublished - May 28 2014
Externally publishedYes

    Fingerprint

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Pardini, T., Boutet, S., Bradley, J., Döppner, T., Fletcher, L. B., Gardner, D. F., Hill, R. M., Hunter, M. S., Krzywinski, J., Messerschmidt, M., Pak, A. E., Quirin, F., Sokolowski-Tinten, K., Williams, G. J., & Hau-Riege, S. P. (2014). Silicon Mirrors for High-Intensity X-Ray Pump and Probe Experiments. Physical Review Applied, 1(4), [044007]. https://doi.org/10.1103/PhysRevApplied.1.044007