Silicon Minority-carrier Lifetime Degradation during Molecular Beam Heteroepitaxial III-V Material Growth

Laura Ding, Chaomin Zhang, Tine Uberg Nærland, Nikolai Faleev, Christiana Honsberg, Mariana Bertoni

Research output: Contribution to journalConference articlepeer-review

26 Scopus citations

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Engineering & Materials Science