Silicon clathrates: Synthesis and characterization

Ganesh K. Ramachandran, Jason Diefenbacher, Otto F. Sankey, Renu Sharma, Robert F. Marzke, Michael O'Keeffe, Jan Gryko, Paul F. McMillan

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Scopus citations


Two types of silicon clathrates, Na xSi 136(0≤x≤24) and Na 8Si 46 and a mixed clathrate (Na,Ba)Si 46 were synthesized and characterized by X-ray diffraction, 23Na NMR and high resolution TEM. Systematic changes in X-ray diffraction intensifies enabled the sodium content and site occupancy in the Na xSi 136 series to be followed and then refined by Rietveld profile analysts. 23Na NMR spectra of Na 8Si 46 and Na xSi 136 samples reveals two peaks with large paramagnetic shifts (1600-2000 ppm) for each phase, associated with the presence of Na atoms in two different environments. High resolution electron microscopy reveals the clathrate structures of these samples, and allows classes of defects to be characterized.

Original languageEnglish (US)
Title of host publicationMaterials Research Society Symposium - Proceedings
EditorsR. Schropp, H.M. Branz, M. Hack, I. Shimizu, S. Wagner
Number of pages4
StatePublished - 1999
EventProceedings of the 1998 MRS Spring Meeting - San Francisco, CA, USA
Duration: Apr 14 1998Apr 17 1998


OtherProceedings of the 1998 MRS Spring Meeting
CitySan Francisco, CA, USA

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials


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