Silicon clathrates: Synthesis and characterization

Ganesh K. Ramachandran; Jason Diefenbacher; Otto F. Sankey; Renu Sharma; Robert F. Marzke; Michael O'Keeffe; Jan Gryko; Paul F. McMillan

Silicon clathrates: Synthesis and characterization

Ganesh K. Ramachandran, Jason Diefenbacher, Otto F. Sankey, Renu Sharma, Robert F. Marzke, Michael O'Keeffe, Jan Gryko, Paul F. McMillan

Physics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

6 Scopus citations

Abstract

Two types of silicon clathrates, Na _xSi ₁₃₆(0≤x≤24) and Na ₈Si ₄₆ and a mixed clathrate (Na,Ba)Si ₄₆ were synthesized and characterized by X-ray diffraction, ²³Na NMR and high resolution TEM. Systematic changes in X-ray diffraction intensifies enabled the sodium content and site occupancy in the Na _xSi ₁₃₆ series to be followed and then refined by Rietveld profile analysts. ²³Na NMR spectra of Na ₈Si ₄₆ and Na _xSi ₁₃₆ samples reveals two peaks with large paramagnetic shifts (1600-2000 ppm) for each phase, associated with the presence of Na atoms in two different environments. High resolution electron microscopy reveals the clathrate structures of these samples, and allows classes of defects to be characterized.

Original language	English (US)
Title of host publication	Materials Research Society Symposium - Proceedings
Editors	R. Schropp, H.M. Branz, M. Hack, I. Shimizu, S. Wagner
Publisher	MRS
Pages	483-486
Number of pages	4
Volume	507
State	Published - 1999
Event	Proceedings of the 1998 MRS Spring Meeting - San Francisco, CA, USA Duration: Apr 14 1998 → Apr 17 1998

Other

Other	Proceedings of the 1998 MRS Spring Meeting
City	San Francisco, CA, USA
Period	4/14/98 → 4/17/98

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials

Cite this

Ramachandran, GK, Diefenbacher, J, Sankey, OF, Sharma, R, Marzke, RF, O'Keeffe, M, Gryko, J & McMillan, PF 1999, Silicon clathrates: Synthesis and characterization. in R Schropp, HM Branz, M Hack, I Shimizu & S Wagner (eds), Materials Research Society Symposium - Proceedings. vol. 507, MRS, pp. 483-486, Proceedings of the 1998 MRS Spring Meeting, San Francisco, CA, USA, 4/14/98.

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abstract = "Two types of silicon clathrates, Na xSi 136(0≤x≤24) and Na 8Si 46 and a mixed clathrate (Na,Ba)Si 46 were synthesized and characterized by X-ray diffraction, 23Na NMR and high resolution TEM. Systematic changes in X-ray diffraction intensifies enabled the sodium content and site occupancy in the Na xSi 136 series to be followed and then refined by Rietveld profile analysts. 23Na NMR spectra of Na 8Si 46 and Na xSi 136 samples reveals two peaks with large paramagnetic shifts (1600-2000 ppm) for each phase, associated with the presence of Na atoms in two different environments. High resolution electron microscopy reveals the clathrate structures of these samples, and allows classes of defects to be characterized. ",

author = "Ramachandran, {Ganesh K.} and Jason Diefenbacher and Sankey, {Otto F.} and Renu Sharma and Marzke, {Robert F.} and Michael O'Keeffe and Jan Gryko and McMillan, {Paul F.}",

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pages = "483--486",

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AU - Ramachandran, Ganesh K.

AU - Diefenbacher, Jason

AU - Sankey, Otto F.

AU - Sharma, Renu

AU - Marzke, Robert F.

AU - O'Keeffe, Michael

AU - Gryko, Jan

AU - McMillan, Paul F.

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N2 - Two types of silicon clathrates, Na xSi 136(0≤x≤24) and Na 8Si 46 and a mixed clathrate (Na,Ba)Si 46 were synthesized and characterized by X-ray diffraction, 23Na NMR and high resolution TEM. Systematic changes in X-ray diffraction intensifies enabled the sodium content and site occupancy in the Na xSi 136 series to be followed and then refined by Rietveld profile analysts. 23Na NMR spectra of Na 8Si 46 and Na xSi 136 samples reveals two peaks with large paramagnetic shifts (1600-2000 ppm) for each phase, associated with the presence of Na atoms in two different environments. High resolution electron microscopy reveals the clathrate structures of these samples, and allows classes of defects to be characterized.

AB - Two types of silicon clathrates, Na xSi 136(0≤x≤24) and Na 8Si 46 and a mixed clathrate (Na,Ba)Si 46 were synthesized and characterized by X-ray diffraction, 23Na NMR and high resolution TEM. Systematic changes in X-ray diffraction intensifies enabled the sodium content and site occupancy in the Na xSi 136 series to be followed and then refined by Rietveld profile analysts. 23Na NMR spectra of Na 8Si 46 and Na xSi 136 samples reveals two peaks with large paramagnetic shifts (1600-2000 ppm) for each phase, associated with the presence of Na atoms in two different environments. High resolution electron microscopy reveals the clathrate structures of these samples, and allows classes of defects to be characterized.

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AN - SCOPUS:0032686786

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EP - 486

BT - Materials Research Society Symposium - Proceedings

A2 - Schropp, R.

A2 - Branz, H.M.

A2 - Hack, M.

A2 - Shimizu, I.

A2 - Wagner, S.

PB - MRS

Y2 - 14 April 1998 through 17 April 1998

ER -

Silicon clathrates: Synthesis and characterization

Abstract

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ASJC Scopus subject areas

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