Photoelectron emission microscopy (PEEM), which has the capability of hih-temperature in situ growth an real time imaging, is employed to observe the dynamics of shape transitions of TiSi2 islands on Si(111) surfaces. In particular, the elongation of initially nearly circular islands into wire structures an dimensional variation of the evolving islands is observed. As such, different cross-sectional shapes of the elongated islands are found.
|Original language||English (US)|
|Number of pages||5|
|Journal||Journal of Applied Physics|
|State||Published - Feb 1 2004|
ASJC Scopus subject areas
- Physics and Astronomy(all)