Abstract

To investigate the role of self-heating effects on the electrical characteristics of nano-scale devices, we implemented a two-dimensional Monte Carlo device simulator that includes the self-consistent solution of the energy balance equations for both acoustic and optical phonons. The acoustic and optical phonon temperatures are fed back into the electron transport solver through temperature dependent scattering tables. The electro-thermal device simulator was used in the study of different generations of nano-scale fully-depleted (FD) Silicon On Insulator (SOI) devices that are either already in production or will be fabricated in the next 5-10 years. We find less degradation due to self-heating in very short channel device structures due to increasing role of non-stationary velocity overshoot effects which are less sensitive to the local temperature.

Original languageEnglish (US)
Title of host publicationTechnical Proceedings of the 2008 NSTI Nanotechnology Conference and Trade Show, NSTI-Nanotech, Nanotechnology 2008
Pages537-540
Number of pages4
Volume3
StatePublished - 2008
Event2008 NSTI Nanotechnology Conference and Trade Show, NSTI Nanotech 2008 Joint Meeting, Nanotechnology 2008 - Quebec City, QC, United States
Duration: Jun 1 2008Jun 5 2008

Other

Other2008 NSTI Nanotechnology Conference and Trade Show, NSTI Nanotech 2008 Joint Meeting, Nanotechnology 2008
CountryUnited States
CityQuebec City, QC
Period6/1/086/5/08

Fingerprint

Simulators
Silicon
Electrons
Acoustics
Heating
Phonons
Energy balance
Temperature
Scattering
Degradation
Hot Temperature
Electron Transport

Keywords

  • BTE
  • Heating effects
  • Monte Carlo method
  • Nanoscale devices
  • Phonons

ASJC Scopus subject areas

  • Mechanical Engineering

Cite this

Goodnick, S., Raleva, K., & Vasileska, D. (2008). Self-consistent thermal electron-phonon simulator for SOI devices. In Technical Proceedings of the 2008 NSTI Nanotechnology Conference and Trade Show, NSTI-Nanotech, Nanotechnology 2008 (Vol. 3, pp. 537-540)

Self-consistent thermal electron-phonon simulator for SOI devices. / Goodnick, Stephen; Raleva, K.; Vasileska, Dragica.

Technical Proceedings of the 2008 NSTI Nanotechnology Conference and Trade Show, NSTI-Nanotech, Nanotechnology 2008. Vol. 3 2008. p. 537-540.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Goodnick, S, Raleva, K & Vasileska, D 2008, Self-consistent thermal electron-phonon simulator for SOI devices. in Technical Proceedings of the 2008 NSTI Nanotechnology Conference and Trade Show, NSTI-Nanotech, Nanotechnology 2008. vol. 3, pp. 537-540, 2008 NSTI Nanotechnology Conference and Trade Show, NSTI Nanotech 2008 Joint Meeting, Nanotechnology 2008, Quebec City, QC, United States, 6/1/08.
Goodnick S, Raleva K, Vasileska D. Self-consistent thermal electron-phonon simulator for SOI devices. In Technical Proceedings of the 2008 NSTI Nanotechnology Conference and Trade Show, NSTI-Nanotech, Nanotechnology 2008. Vol. 3. 2008. p. 537-540
Goodnick, Stephen ; Raleva, K. ; Vasileska, Dragica. / Self-consistent thermal electron-phonon simulator for SOI devices. Technical Proceedings of the 2008 NSTI Nanotechnology Conference and Trade Show, NSTI-Nanotech, Nanotechnology 2008. Vol. 3 2008. pp. 537-540
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