TY - GEN
T1 - Self-checking and self-diagnosing 32-bit microprocessor multiplier
AU - Yilmaz, Mahmut
AU - Hower, Derek R.
AU - Ozev, Sule
AU - Sorin, Daniel J.
PY - 2006
Y1 - 2006
N2 - In this paper, we propose a low-cost fault tolerance technique for microprocessor multipliers, both non-pipelined (NP) and pipelined (P). Our fault tolerant multiplier designs are capable of detecting and correcting errors, diagnosing hard faults, and reconfiguring to take the faulty subunit off-line. We utilize the branch misprediction recovery mechanism in the microprocessor core to take the error detection process off the critical path. Our analysis shows that our scheme provides 99% fault security and, compared to a baseline unprotected multiplier, achieves this fault tolerance with low performance overhead (5% for NP and 2.5% for P multiplier) and reasonably low area (38% NP and 26% P) and power consumption (36% NP and 28.5% P) overheads.
AB - In this paper, we propose a low-cost fault tolerance technique for microprocessor multipliers, both non-pipelined (NP) and pipelined (P). Our fault tolerant multiplier designs are capable of detecting and correcting errors, diagnosing hard faults, and reconfiguring to take the faulty subunit off-line. We utilize the branch misprediction recovery mechanism in the microprocessor core to take the error detection process off the critical path. Our analysis shows that our scheme provides 99% fault security and, compared to a baseline unprotected multiplier, achieves this fault tolerance with low performance overhead (5% for NP and 2.5% for P multiplier) and reasonably low area (38% NP and 26% P) and power consumption (36% NP and 28.5% P) overheads.
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U2 - 10.1109/TEST.2006.297634
DO - 10.1109/TEST.2006.297634
M3 - Conference contribution
AN - SCOPUS:39749132260
SN - 1424402921
SN - 9781424402922
T3 - Proceedings - International Test Conference
BT - 2006 IEEE International Test Conference, ITC
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2006 IEEE International Test Conference, ITC
Y2 - 22 October 2006 through 27 October 2006
ER -