Selection of best methods to calculate degradation rates of PV modules

Sanjay Shrestha, Govindasamy Tamizhmani

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Abstract

Three different PV systems were evaluated to compute degradation rates using four different methods and the methods are: I-V measurement metered raw kWh, performance ratio (PR) and performance index (PI). I-V method, being an ideal and the best method for degradation rate computation, was compared to the results obtained from other three methods. The median degradation rates computed from kWh method were within ±0.15% from I-V measured degradation rates (0.9-1.37 %/year for three systems). The degradation rates computed from the PI method were within ±0.05% from the I-V measured rates for two systems but the calculated degradation rate was remarkably different (±1%) from the I-V method for the third system. The degradation rate computed from the PR method was within ±0.16% from the I-V measured rate for only one system but they were remarkably different (±1%) from the I-V measured rates for the other two systems. Thus, it was concluded that metered raw kWh method is the best practical method, after the I-V method and PI method (if ground mounted POA insolation and other weather data are available) for degradation computation as this method was found to be fairly accurate, easy, inexpensive and fast.

Original languageEnglish (US)
Title of host publication2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781479979448
DOIs
StatePublished - Dec 14 2015
Event42nd IEEE Photovoltaic Specialist Conference, PVSC 2015 - New Orleans, United States
Duration: Jun 14 2015Jun 19 2015

Other

Other42nd IEEE Photovoltaic Specialist Conference, PVSC 2015
CountryUnited States
CityNew Orleans
Period6/14/156/19/15

Fingerprint

Degradation
Incident solar radiation

Keywords

  • crystalline silicon modules
  • degradation
  • performance index
  • performance ratio
  • statistical

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

Cite this

Shrestha, S., & Tamizhmani, G. (2015). Selection of best methods to calculate degradation rates of PV modules. In 2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015 [7355703] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2015.7355703

Selection of best methods to calculate degradation rates of PV modules. / Shrestha, Sanjay; Tamizhmani, Govindasamy.

2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015. Institute of Electrical and Electronics Engineers Inc., 2015. 7355703.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Shrestha, S & Tamizhmani, G 2015, Selection of best methods to calculate degradation rates of PV modules. in 2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015., 7355703, Institute of Electrical and Electronics Engineers Inc., 42nd IEEE Photovoltaic Specialist Conference, PVSC 2015, New Orleans, United States, 6/14/15. https://doi.org/10.1109/PVSC.2015.7355703
Shrestha S, Tamizhmani G. Selection of best methods to calculate degradation rates of PV modules. In 2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015. Institute of Electrical and Electronics Engineers Inc. 2015. 7355703 https://doi.org/10.1109/PVSC.2015.7355703
Shrestha, Sanjay ; Tamizhmani, Govindasamy. / Selection of best methods to calculate degradation rates of PV modules. 2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015. Institute of Electrical and Electronics Engineers Inc., 2015.
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