Selected configuration tradeoffs of contour optical instruments

J. Warren, K. Strohbehn, S. Murchie, D. Fort, E. Reynolds, G. Heyler, K. Peacock, J. Boldt, E. Darlington, J. Hayes, R. Henshaw, N. Izenberg, C. Kardian, J. Lees, D. Lohr, D. Mehoke, E. Schaefer, T. Sholar, T. Spisz, C. WilleyJ. Veverka, J. Bell, A. Cochran

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Engineering & Materials Science