Engineering & Materials Science
High-k dielectric
100%
Self assembled monolayers
98%
Atomic layer deposition
97%
Graphene
74%
Dielectric films
46%
Nanoelectronics
29%
Aluminum oxide
20%
Scanning tunneling microscopy
18%
Ellipsometry
17%
Ultrahigh vacuum
16%
Graphene oxide
15%
Defect density
15%
Sublimation
14%
Atomic force microscopy
13%
X ray photoelectron spectroscopy
12%
Leakage currents
11%
X rays
9%
Capacitance
9%
Capacitors
8%
Scanning electron microscopy
8%
Metals
6%
Chemical Compounds
Atomic Layer Epitaxy
73%
Dielectric Film
69%
Self Assembled Monolayer
61%
Dielectric Material
56%
Graphene
44%
Leakage Current
20%
Reflectivity
18%
Sublimation
18%
Ellipsometry
17%
Scanning Tunneling Microscopy
16%
Capacitor
16%
Vacuum
12%
Atomic Force Microscopy
12%
X-Ray Photoelectron Spectroscopy
11%
X-Ray
9%
Scanning Electron Microscopy
9%
Chemistry
9%
Liquid Film
7%
Reaction Yield
6%
Physics & Astronomy
inoculation
70%
atomic layer epitaxy
66%
graphene
51%
pinholes
10%
sublimation
10%
viability
9%
ultrahigh vacuum
9%
ellipsometry
8%
scanning tunneling microscopy
8%
metal oxides
8%
x rays
8%
capacitors
7%
chemistry
7%
leakage
7%
photoelectron spectroscopy
7%
capacitance
7%
atomic force microscopy
6%
wafers
6%
reflectance
6%
scanning electron microscopy
5%
high resolution
5%
defects
5%
performance
4%
Medicine & Life Sciences
Graphite
87%
Perylene
79%
Scanning Tunnelling Microscopy
21%
graphene oxide
16%
Photoelectron Spectroscopy
15%
Atomic Force Microscopy
12%
Vacuum
12%
Electron Scanning Microscopy
10%
Metals
9%
X-Rays
8%