Secondary ion mass spectrometer analyses for trace elements in glass standards using variably charged silicon ions for normalization

Physics & Astronomy

• trace elements 100%
• mass spectrometers 77%
• glass 43%
• silicon 40%
• ions 35%
• normalizing 33%
• matrices 27%
• secondary ion mass spectrometry 25%
• silicates 24%
• silicon isotopes 21%
• warning 16%
• light elements 15%
• calcium oxides 14%
• curves 13%
• beryllium 13%
• atoms 12%
• lithium 11%
• isotopes 10%
• boron 10%
• kinetic energy 10%
• oxygen 7%
• energy 3%

Earth & Environmental Sciences

• normalization 78%
• silicon 68%
• spectrometer 63%
• glass 57%
• trace element 57%
• ion 47%
• matrix 22%
• calibration 19%
• mass spectrometry 16%
• silicate 15%
• isotope 14%
• conventional energy 13%
• beryllium 12%
• lithium 10%
• boron 9%
• kinetic energy 8%
• effect 8%
• lime 8%
• rate 6%
• oxygen 6%
• laboratory 5%
• material 3%

Chemical Compounds

• Secondary Ion 95%
• Glass 51%
• Secondary Ion Mass Spectroscopy 32%
• Ion 29%
• Analytical Calibration 26%
• Isotope 26%
• Silicate Glass 18%
• Kinetic Energy 17%
• Boron Atom 13%
• Filtration 13%
• Dioxygen 7%
• Energy 7%
• Reaction Yield 6%