Abstract
The production of secondary electrons by fast (100 keV) electrons is investigated by analyzing the time coincidence between inelastically scattered incident electrons and energy-filtered secondary electrons. Thin conducting and semiconducting films show differences in both the coincidence and generation spectra at energies near the bulk-plasmon excitation, suggesting that plasmon decay does not play a central role in the production of secondary electrons in Si. At primary energy losses greater than 35 eV, the secondary-electron production rate is proportional to the energy deposited by the incident electrons.
Original language | English (US) |
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Pages (from-to) | 4068-4071 |
Number of pages | 4 |
Journal | Physical Review B |
Volume | 47 |
Issue number | 7 |
DOIs | |
State | Published - 1993 |
ASJC Scopus subject areas
- Condensed Matter Physics