Secondary-electron production pathways determined by coincidence electron spectroscopy

M. R. Scheinfein, Jeffery Drucker, J. K. Weiss

Research output: Contribution to journalArticle

29 Scopus citations

Abstract

The production of secondary electrons by fast (100 keV) electrons is investigated by analyzing the time coincidence between inelastically scattered incident electrons and energy-filtered secondary electrons. Thin conducting and semiconducting films show differences in both the coincidence and generation spectra at energies near the bulk-plasmon excitation, suggesting that plasmon decay does not play a central role in the production of secondary electrons in Si. At primary energy losses greater than 35 eV, the secondary-electron production rate is proportional to the energy deposited by the incident electrons.

Original languageEnglish (US)
Pages (from-to)4068-4071
Number of pages4
JournalPhysical Review B
Volume47
Issue number7
DOIs
Publication statusPublished - 1993

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ASJC Scopus subject areas

  • Condensed Matter Physics

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