Secondary electron emission of chemical-vapor-deposited diamond by impact of slow H ⁺, D ⁺, H ₂ ⁺, C ⁺, O ⁺, and O ₂ ⁺+ ions

We report on the measurements of the secondary electron yield of chemical-vapor-deposited diamond upon the reflection of primary H+, D+, H2+, C+, O+, and O2+ ions in an energy range of 50-1000 eV per atom at a 60° angle of incidence to the surface normal. Depending on the species and energy, a secondary electron yield between 0.1 and 2 was observed and remained unchanged over weeks without further periodic reconditioning of the surface and in spite of the moderate vacuum environment of 10-7 mbar. Semiempirical fit functions were found with a dependence on the inverse velocity and the square root of the atomic number of the projectiles.