Secondary electron emission of chemical-vapor-deposited diamond by impact of slow H +, D +, H 2 +, C +, O +, and O 2 ++ ions

M. Wieser, P. Wurz, R. J. Nemanich, S. A. Fuselier

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Abstract

We report on the measurements of the secondary electron yield of chemical-vapor-deposited diamond upon the reflection of primary H+, D+, H2+, C+, O+, and O2+ ions in an energy range of 50-1000 eV per atom at a 60° angle of incidence to the surface normal. Depending on the species and energy, a secondary electron yield between 0.1 and 2 was observed and remained unchanged over weeks without further periodic reconditioning of the surface and in spite of the moderate vacuum environment of 10-7 mbar. Semiempirical fit functions were found with a dependence on the inverse velocity and the square root of the atomic number of the projectiles.

Original languageEnglish (US)
Article number034906
JournalJournal of Applied Physics
Volume98
Issue number3
DOIs
StatePublished - Aug 1 2005
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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