The semiconductor device testing methodology based on the testing of digital components in mixed-signal paths is discussed. The defined digital testing approach for digital modules is based on the propagation of test inputs and responses through a path containing analog signals. The novel functional-interface mechanism for seamless test propagation across the analog to digital (A/D) divide in mixed-signal silicon-on-chips (SoCs) reduces the test application overhead from test points and buses. The methodology for computing the fault coverage and the effect of noise on the obtained fault coverage value are also discussed.
ASJC Scopus subject areas
- Hardware and Architecture
- Electrical and Electronic Engineering