Scenario-based test case generation for state-based embedded systems

W. T. Tsai, L. Yu, X. X. Liu, A. Saimi, Y. Xiao

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

To reduce testing cost and effort, this paper proposes a systematic approach to generate test cases for state-based embedded systems. This process first derives a state/event tree based on a scenario specification, and a node of the tree represents a state, a link a transition between two states. Once the tree is obtained, it is possible to generate test inputs based on partition testing, random testing and boundary value testing. It is also possible to perform various analysis such as completeness and consistency analysis, dependency analysis and relationship analysis. An XML-based tool has been developed to automate many of the steps in the process. Whenever there is a change to the system, the tester needs to modify the state/event tree, and the tool will automatically re-generate the new test cases to test those changed parts as well as perform selective regression testing to test those affected parts.

Original languageEnglish (US)
Title of host publicationIEEE International Performance, Computing and Communications Conference, Proceedings
EditorsA.D. George, E. Johnson, G.G. Richard III, G. Xue
Pages335-342
Number of pages8
StatePublished - 2003
Event22nd IEEE International Performance, Computing, and Communications Conference - Phoenix, AZ, United States
Duration: Apr 9 2003Apr 11 2003

Other

Other22nd IEEE International Performance, Computing, and Communications Conference
CountryUnited States
CityPhoenix, AZ
Period4/9/034/11/03

Fingerprint

Embedded systems
Testing
XML
Specifications
Costs

ASJC Scopus subject areas

  • Media Technology

Cite this

Tsai, W. T., Yu, L., Liu, X. X., Saimi, A., & Xiao, Y. (2003). Scenario-based test case generation for state-based embedded systems. In A. D. George, E. Johnson, G. G. Richard III, & G. Xue (Eds.), IEEE International Performance, Computing and Communications Conference, Proceedings (pp. 335-342)

Scenario-based test case generation for state-based embedded systems. / Tsai, W. T.; Yu, L.; Liu, X. X.; Saimi, A.; Xiao, Y.

IEEE International Performance, Computing and Communications Conference, Proceedings. ed. / A.D. George; E. Johnson; G.G. Richard III; G. Xue. 2003. p. 335-342.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Tsai, WT, Yu, L, Liu, XX, Saimi, A & Xiao, Y 2003, Scenario-based test case generation for state-based embedded systems. in AD George, E Johnson, GG Richard III & G Xue (eds), IEEE International Performance, Computing and Communications Conference, Proceedings. pp. 335-342, 22nd IEEE International Performance, Computing, and Communications Conference, Phoenix, AZ, United States, 4/9/03.
Tsai WT, Yu L, Liu XX, Saimi A, Xiao Y. Scenario-based test case generation for state-based embedded systems. In George AD, Johnson E, Richard III GG, Xue G, editors, IEEE International Performance, Computing and Communications Conference, Proceedings. 2003. p. 335-342
Tsai, W. T. ; Yu, L. ; Liu, X. X. ; Saimi, A. ; Xiao, Y. / Scenario-based test case generation for state-based embedded systems. IEEE International Performance, Computing and Communications Conference, Proceedings. editor / A.D. George ; E. Johnson ; G.G. Richard III ; G. Xue. 2003. pp. 335-342
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