Scenario-based functional regression testing

W. T. Tsai, X. Bai, R. Paul, L. Yu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

46 Scopus citations

Abstract

Regression testing has been a popular quality-assurance technique. Most regression testing techniques are based on code or software design. This paper proposes a scenario-based functional regression testing, which is based on end-to-end (E2E) integration test scenarios. The test scenarios are first represented in a template model that embodies both test dependency and traceability. By using test dependency information, one can obtain a test slicing algorithm to detect the scenarios that are affected and thus they are candidates for regression testing. By using traceability information, one can find affected components and their associated test scenarios and test cases for regression testing. With the same dependency and traceability information one can use the ripple effect analysis to identify all affected, including directly or indirectly, scenarios and thus the set of test cases can be selected for regression testing. This paper also provides several alternative test-case selection approaches and a hybrid approach to meet various requirements. A web-based tool has been developed to support these regression testing tasks.

Original languageEnglish (US)
Title of host publicationProceedings - IEEE Computer Society's International Computer Software and Applications Conference
Pages496-501
Number of pages6
StatePublished - 2001
Event25th Annual International Computer Software and Applications Conference (COMPSAC)2001 - Chicago, IL, United States
Duration: Oct 8 2001Oct 12 2001

Other

Other25th Annual International Computer Software and Applications Conference (COMPSAC)2001
CountryUnited States
CityChicago, IL
Period10/8/0110/12/01

ASJC Scopus subject areas

  • Software

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  • Cite this

    Tsai, W. T., Bai, X., Paul, R., & Yu, L. (2001). Scenario-based functional regression testing. In Proceedings - IEEE Computer Society's International Computer Software and Applications Conference (pp. 496-501)