Scanning tunnelling microscopy studies of silicides

Peter Bennett, H. Von Känel

Research output: Contribution to journalArticle

22 Scopus citations

Abstract

We review the topic of scanning tunneling microscopy (STM) studies of silicides, with an emphasis on fundamental scientific issues that can be addressed using STM and ballistic-electron-emission microscopy (BEEM). The discussion is organized according to the topics of structure (atomic scale precursors, surface reconstructions, bulk structures, interfaces) kinetics and growth (direct atomic measurement, modelling, stoichiometry, layer and island growth, phase transitions and nanoscale metallization) and BEEM (method, band structure, Schottky barrier, defect scattering, inelastic scattering and surface effects). These topics are described in general terms, then elaborated with specific examples.

Original languageEnglish (US)
Pages (from-to)R71-R87
JournalJournal of Physics D: Applied Physics
Volume32
Issue number15
DOIs
StatePublished - Aug 7 1999

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Acoustics and Ultrasonics
  • Surfaces, Coatings and Films

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