Scaling theory in modern VLSI: Factors affecting interconnects, wire length, and clock speed

D. K. Ferry, L. A. Akers

Research output: Contribution to journalArticle

12 Scopus citations
Original languageEnglish (US)
Pages (from-to)41-44
Number of pages4
JournalIEEE Circuits and Devices Magazine
Volume13
Issue number5
DOIs
StatePublished - Sep 1 1997

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Instrumentation
  • Electrical and Electronic Engineering

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