Scaling of gate length in ultra-short channel heterostructure field effect transistors

Jaeheon Han, David K. Ferry

Research output: Contribution to journalArticlepeer-review

17 Scopus citations

Fingerprint

Dive into the research topics of 'Scaling of gate length in ultra-short channel heterostructure field effect transistors'. Together they form a unique fingerprint.

Chemical Compounds

Engineering & Materials Science

Physics & Astronomy