TY - GEN
T1 - Scaling error of quantum efficiency measurements for heavily shunted cells in reliability research
AU - Oh, Jaewon
AU - Tamizhmani, Govindasamy
AU - Bowden, Stuart
N1 - Publisher Copyright:
© 2014 IEEE.
PY - 2014/10/15
Y1 - 2014/10/15
N2 - In photovoltaic (PV) cell and module reliability and durability research, it is of great importance to acquire an accurate quantum efficiency (QE) data of shunted cells which may be obtained after certain accelerated stress tests such as potential induced degradation (PID). The challenge in measuring accurate quantum efficiency of shunted cells stems from the interplay between the poor shunt resistance and the inherent impedance imposed by the traditional QE test equipment. Unless this test equipment related impedance is very, very low, the scaling error of the measured QE would be significant. A new very low impedance method which minimizes, but not totally eliminates, those erroneous drops in the QE system has been utilized to address the scaling error of the QE data of solar cells that have very low shunt resistances. This paper presents the challenges in measuring accurate QE of heavily shunted cells without measurement artifacts and the QE results obtained with and without the newly utilized low input impedance method.
AB - In photovoltaic (PV) cell and module reliability and durability research, it is of great importance to acquire an accurate quantum efficiency (QE) data of shunted cells which may be obtained after certain accelerated stress tests such as potential induced degradation (PID). The challenge in measuring accurate quantum efficiency of shunted cells stems from the interplay between the poor shunt resistance and the inherent impedance imposed by the traditional QE test equipment. Unless this test equipment related impedance is very, very low, the scaling error of the measured QE would be significant. A new very low impedance method which minimizes, but not totally eliminates, those erroneous drops in the QE system has been utilized to address the scaling error of the QE data of solar cells that have very low shunt resistances. This paper presents the challenges in measuring accurate QE of heavily shunted cells without measurement artifacts and the QE results obtained with and without the newly utilized low input impedance method.
KW - PID
KW - QE
KW - durability
KW - photovoltaic cells
KW - reliability
KW - shunting
UR - http://www.scopus.com/inward/record.url?scp=84912084568&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84912084568&partnerID=8YFLogxK
U2 - 10.1109/PVSC.2014.6925470
DO - 10.1109/PVSC.2014.6925470
M3 - Conference contribution
AN - SCOPUS:84912084568
T3 - 2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014
SP - 2635
EP - 2638
BT - 2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 40th IEEE Photovoltaic Specialist Conference, PVSC 2014
Y2 - 8 June 2014 through 13 June 2014
ER -