SAR image compression using wavelets

C. Kwan, Baoxin Li, R. Xu, T. Tran, T. Nguyen, J. Hopkins, U. Boston

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Scopus citations

Abstract

A new wavelet based image coder is proposed for SAR image compression. The coding technique known as OBTWC (Overlapped Block Transform Wavelet Coder) consists of three steps. First, a set of overlapped block transforms is used to transform the image data into 8×8 blocks in the frequency domain. Second, a mapping is then performed to convert the transformed image into a multiresolution representation that resembles the zero-tree wavelet transform. Third, the multiresolution representation is then coded by a conventional dyadic wavelet coder, which basically truncates the high frequency contents in a very efficient manner. Our proposed method essentially combines the advantages of both block transform and wavelet coding techniques while eliminating their respective weaknesses. The image compression algorithm was applied to SAR images supplied by Air Force, Army, and NASA. The compression performance in terms of Peak Signal-to-Noise Ratio is better than that of a commercial wavelet coder in the market.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsH.H. Szu, D.L. Donoho, A.W. Lohmann, W.J. Campbell, J.R. Bussy
Pages349-357
Number of pages9
Volume4391
DOIs
StatePublished - 2001
Externally publishedYes
EventWavelet Applications VIII - Orlando, FL, United States
Duration: Apr 18 2001Apr 20 2001

Other

OtherWavelet Applications VIII
CountryUnited States
CityOrlando, FL
Period4/18/014/20/01

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

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    Kwan, C., Li, B., Xu, R., Tran, T., Nguyen, T., Hopkins, J., & Boston, U. (2001). SAR image compression using wavelets. In H. H. Szu, D. L. Donoho, A. W. Lohmann, W. J. Campbell, & J. R. Bussy (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 4391, pp. 349-357) https://doi.org/10.1117/12.421215