Sample preparation for precise and quantitative electron holographic analysis of semiconductor devices

Engineering & Materials Science

• Electron holography 100%
• Silicon oxides 64%
• Semiconductor devices 51%
• Polishing 48%
• Field effect transistors 47%
• Electrostatics 47%
• Electrons 44%
• Metals 28%
• Silica 22%
• Transmission electron microscopy 22%
• Ions 20%
• Chemical analysis 14%

Medicine & Life Sciences

• Holography 78%
• Semiconductors 63%
• Silicon 53%
• Oxides 53%
• Static Electricity 52%
• Metals 38%
• Electrons 35%
• Equipment and Supplies 26%
• Silicon Dioxide 25%
• Transmission Electron Microscopy 22%
• Artifacts 21%
• Suspensions 19%
• Ions 18%

Physics & Astronomy

• semiconductor devices 45%
• preparation 32%
• silicon transistors 30%
• polishing 23%
• holography 21%
• metal oxides 21%
• electrons 18%
• field effect transistors 17%
• electrostatics 16%
• p-n junctions 11%
• quantitative analysis 11%
• wedges 11%
• artifacts 10%
• charging 10%
• silicon dioxide 8%
• transmission electron microscopy 7%
• ions 5%