Runtime Abstraction-Level Conversion of Discrete-Event Wafer-fabrication Models for Simulation Acceleration

Moon G.I. Seok, Chew Wye Chan, Wentong Cai, Hessam S. Sarjoughian, Daejin Park

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Speeding up the simulation of discrete-event wafer fab models is essential because optimizing the scheduling and dispatching policies under various circumstances requires repeated evaluation of the decision candidates during parameter-space exploration. In this paper, we present a runtime abstraction-level conversion approach for discrete-event wafer-fabrication (wafer-fab) models to gain simulation speedup. During the simulation, if a machine group of the wafer fab models reaches a steady state, then the proposed approach attempts to substitute this group model with a mean-delay model (MDM) as a high abstraction level model. The MDM abstracts the detailed operations of the group's sub-component models into an average delay based on the queueing modeling, which can guarantee acceptable accuracy under steady state. The proposed abstraction-level converter (ALC) observes the queueing parameters of low-level groups to identify the convergence of each group's work-in-progress (WIP) level through a statistical test. When a group's WIP level is converged, the output-to-input couplings between the models are revised to change a wafer-lot process flow from the low-level group to a mean-delay model. When the ALC detects a divergence caused by a re-entrant flow or a machine-down, the high-level model is switched back to its corresponding low-level group model. The ALC then generates dummy wafer-lot events to synchronize the busyness of high-level steady state. The proposed method was applied to case studies of wafer-fab systems and achieves simulation speedup from 6.1 to 11.8 times with corresponding 2.5 to 5.9% degradation inaccuracy.

Original languageEnglish (US)
Title of host publicationSIGSIM-PADS 2020 - Proceedings of the 2020 ACM SIGSIM Conference on Principles of Advanced Discrete Simulation
PublisherAssociation for Computing Machinery, Inc
Pages83-92
Number of pages10
ISBN (Electronic)9781450375924
DOIs
StatePublished - Jun 15 2020
Event2020 ACM SIGSIM Conference on Principles of Advanced Discrete Simulation, SIGSIM-PADS 2020 - Miami, United States
Duration: Jun 15 2020Jun 17 2020

Publication series

NameSIGSIM-PADS 2020 - Proceedings of the 2020 ACM SIGSIM Conference on Principles of Advanced Discrete Simulation

Conference

Conference2020 ACM SIGSIM Conference on Principles of Advanced Discrete Simulation, SIGSIM-PADS 2020
CountryUnited States
CityMiami
Period6/15/206/17/20

Keywords

  • abstraction-level conversion
  • discrete-event modeling
  • multi-level simulation
  • wafer fabrication

ASJC Scopus subject areas

  • Computer Graphics and Computer-Aided Design
  • Modeling and Simulation

Fingerprint Dive into the research topics of 'Runtime Abstraction-Level Conversion of Discrete-Event Wafer-fabrication Models for Simulation Acceleration'. Together they form a unique fingerprint.

  • Cite this

    Seok, M. G. I., Chan, C. W., Cai, W., Sarjoughian, H. S., & Park, D. (2020). Runtime Abstraction-Level Conversion of Discrete-Event Wafer-fabrication Models for Simulation Acceleration. In SIGSIM-PADS 2020 - Proceedings of the 2020 ACM SIGSIM Conference on Principles of Advanced Discrete Simulation (pp. 83-92). (SIGSIM-PADS 2020 - Proceedings of the 2020 ACM SIGSIM Conference on Principles of Advanced Discrete Simulation). Association for Computing Machinery, Inc. https://doi.org/10.1145/3384441.3395982