Role of scanning probe microscopes in the development of nanoelectric devices

Arunava Majumdar, Stuart Lindsay

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

The last six years have witnessed the rapid development of several techniques of nanometer and atomic scale material manipulation using scanning probe microscopes (SPM). A stage has now been reached where we can explore the possibilities of using this technology to make practical nanometer-scale electronic devices. We feel that there are two key elements to this issue-(i) a nano-device must be physically accessible to the macro-world; and (ii) a nano-device that exploits quantum phenomena should be electronically accessible and should operate under ambient conditions. In view of this, the first part of the paper is devoted to discussing the different SPM lithographic techniques that will form the physical interface between the micrometer and the nanometer scales. The second part critically explores the possibilities of using SPM for developing molecular electronic devices, arguing that their small size may allow single-electron effects to be exploited at ambient temperatures.

Original languageEnglish (US)
Article number1031004
Pages (from-to)33-57
Number of pages25
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume10310
DOIs
StatePublished - Oct 3 1993

Fingerprint

Microscope
Scanning
Microscopes
Probe
microscopes
scanning
probes
Electronic scales
Molecular electronics
Electronics
Macros
molecular electronics
ambient temperature
micrometers
Manipulation
manipulators
Electrons
Electron
electronics
Temperature

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Role of scanning probe microscopes in the development of nanoelectric devices. / Majumdar, Arunava; Lindsay, Stuart.

In: Proceedings of SPIE - The International Society for Optical Engineering, Vol. 10310, 1031004, 03.10.1993, p. 33-57.

Research output: Contribution to journalArticle

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