Robust design of high fan-in/out subthreshold circuits

Jinhui Chen, Lawrence T. Clark, Yu Cao

Research output: Chapter in Book/Report/Conference proceedingConference contribution

19 Citations (Scopus)

Abstract

Operating CMOS circuits with power supplies below the threshold voltage has been suggested for ultra-low power systems. High fan-in or fan-out circuits, such as those in memories, are prone to failure when operating in this regime. Vanishing noise margins due to reduced transistor on-to-off current ratios result in circuit failure as the supply voltage shrinks. Therefore, design guidelines for robust subthreshold logic circuit are developed in this paper. First, an analytical model is derived to determine a circuit's fan-in/out limitations and the minimum supply voltage for robust subthreshold operation. Excellent agreement between the analytical model and circuit simulations is shown. This model is applied to the analysis of circuit robustness as affected by design choices, both systematic and random processing variations, supply voltage fluctuations, and temperature variations.

Original languageEnglish (US)
Title of host publicationProceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors
Pages405-410
Number of pages6
Volume2005
DOIs
StatePublished - 2005
Event2005 IEEE International Conference on Computer Design: VLSI in Computers and Processors, ICCD 2005 - San Jose, CA, United States
Duration: Oct 2 2005Oct 5 2005

Other

Other2005 IEEE International Conference on Computer Design: VLSI in Computers and Processors, ICCD 2005
CountryUnited States
CitySan Jose, CA
Period10/2/0510/5/05

Fingerprint

Networks (circuits)
Analytical models
Electric potential
Circuit simulation
Logic circuits
Threshold voltage
Fans
Transistors
Data storage equipment
Processing
Temperature

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Hardware and Architecture

Cite this

Chen, J., Clark, L. T., & Cao, Y. (2005). Robust design of high fan-in/out subthreshold circuits. In Proceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors (Vol. 2005, pp. 405-410). [1524183] https://doi.org/10.1109/ICCD.2005.96

Robust design of high fan-in/out subthreshold circuits. / Chen, Jinhui; Clark, Lawrence T.; Cao, Yu.

Proceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors. Vol. 2005 2005. p. 405-410 1524183.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Chen, J, Clark, LT & Cao, Y 2005, Robust design of high fan-in/out subthreshold circuits. in Proceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors. vol. 2005, 1524183, pp. 405-410, 2005 IEEE International Conference on Computer Design: VLSI in Computers and Processors, ICCD 2005, San Jose, CA, United States, 10/2/05. https://doi.org/10.1109/ICCD.2005.96
Chen J, Clark LT, Cao Y. Robust design of high fan-in/out subthreshold circuits. In Proceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors. Vol. 2005. 2005. p. 405-410. 1524183 https://doi.org/10.1109/ICCD.2005.96
Chen, Jinhui ; Clark, Lawrence T. ; Cao, Yu. / Robust design of high fan-in/out subthreshold circuits. Proceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors. Vol. 2005 2005. pp. 405-410
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