Abstract
Inductive and capacitive coupling effects for high-speed global interconnects are studied via simulation. The impact of inductive coupling on delay and noise is found to be comparable to capacitive effects in high-speed buses. The results indicate that current-return paths are not strictly bounded by wide VDD/GND lines, so that inductive coupling is only partially eliminated by using shield wires. Shielding strategies for noise- and delay-sensitive nets is proposed, considering worst-case switching patterns.
| Original language | English (US) |
|---|---|
| Title of host publication | Technical Digest - International Electron Devices Meeting |
| Pages | 731-733 |
| Number of pages | 3 |
| State | Published - 2000 |
| Externally published | Yes |
| Event | 2000 IEEE International Electron Devices Meeting - San Francisco, CA, United States Duration: Dec 10 2000 → Dec 13 2000 |
Other
| Other | 2000 IEEE International Electron Devices Meeting |
|---|---|
| Country/Territory | United States |
| City | San Francisco, CA |
| Period | 12/10/00 → 12/13/00 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering