Rigorous Coupled Wave Analysis of GaAs Thermophotovoltaic Devices with a Patterned Dielectric Back Contact

Madhan K. Arulanandam, Jeronimo Buencuerpo, Myles A. Steiner, Eric J. Tervo, Leah Y. Kuritzky, Emmett E. Perl, Brendan M. Kayes, Justin A. Briggs, Richard R. King

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

In principle, a patterned dielectric back contact structure in a GaAs thermophotovoltaic device boosts the sub-bandgap reflectance. Rigorous coupled wave analysis method is used to study the three dimensional (3D) periodic grating effects of metal point contact diameter and spacing on sub-bandgap reflectance of the device.

Original languageEnglish (US)
Title of host publication2021 IEEE 48th Photovoltaic Specialists Conference, PVSC 2021
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages2580-2583
Number of pages4
ISBN (Electronic)9781665419222
DOIs
StatePublished - Jun 20 2021
Event48th IEEE Photovoltaic Specialists Conference, PVSC 2021 - Fort Lauderdale, United States
Duration: Jun 20 2021Jun 25 2021

Publication series

NameConference Record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)0160-8371

Conference

Conference48th IEEE Photovoltaic Specialists Conference, PVSC 2021
Country/TerritoryUnited States
CityFort Lauderdale
Period6/20/216/25/21

Keywords

  • diffraction grating
  • efficiency
  • GaAs
  • patterned dielectric back contact
  • rigorous coupled wave analysis
  • sub-bandgap spectrum
  • thermophotovoltaics

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering

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