Abstract
A rigorous spectral domain Green's function/Galerkin approach has been proposed by the authors (1988). It accurately models the effect of connecting a vertical probe feed to the patch. This approach is quite versatile and has been applied to a number of probe-fed patch geometries. In the present work, a general description of this technique is given, and its application to a variety of microstrip patch geometries is discussed. Data generated by the numerical models are compared to measured data for both radiation and scattering cases. In particular, the measured input reflection coefficient of a probe-fed rectangular patch is compared to calculations made using both the rigorous solution described and the idealized probe feed model.
| Original language | English (US) |
|---|---|
| Title of host publication | IEEE Antennas and Propagation Society, AP-S International Symposium (Digest) |
| Publisher | Publ by IEEE |
| Pages | 350-353 |
| Number of pages | 4 |
| Volume | 1 |
| State | Published - 1990 |
| Event | 1990 Antennas and Propagation Symposium Digest - Dallas, TX, USA Duration: May 7 1990 → May 11 1990 |
Other
| Other | 1990 Antennas and Propagation Symposium Digest |
|---|---|
| City | Dallas, TX, USA |
| Period | 5/7/90 → 5/11/90 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering