Fingerprint
Dive into the research topics of 'Review and analysis of the radiation-induced degradation observed for the input bias current of linear integrated circuits'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Laurent Dusseau, Muriel Bernard, Jérôme Boch, Yago Gonzalez Velo, Nicolas Roche, Eric Lorfèvre, Françoise Bezerra, Philippe Calvel, Ronan Marec, Frédéric Saigne
Research output: Contribution to journal › Article › peer-review