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Review and analysis of the radiation-induced degradation observed for the input bias current of linear integrated circuits
Laurent Dusseau, Muriel Bernard, Jérôme Boch, Yago Gonzalez Velo, Nicolas Roche, Eric Lorfèvre, Françoise Bezerra, Philippe Calvel, Ronan Marec, Frédéric Saigne
Research output: Contribution to journal › Article › peer-review
27
Scopus
citations