Review and analysis of the radiation-induced degradation observed for the input bias current of linear integrated circuits

Laurent Dusseau, Muriel Bernard, Jérôme Boch, Yago Gonzalez Velo, Nicolas Roche, Eric Lorfèvre, Françoise Bezerra, Philippe Calvel, Ronan Marec, Frédéric Saigne

Research output: Contribution to journalArticlepeer-review

24 Scopus citations

Fingerprint Dive into the research topics of 'Review and analysis of the radiation-induced degradation observed for the input bias current of linear integrated circuits'. Together they form a unique fingerprint.

Engineering & Materials Science

Physics & Astronomy