Revealing anelasticity and structural rearrangements in nanoscale metallic glass films using in situ TEM diffraction

Rohit Sarkar, Christian Ebner, Ehsan Izadi, Christian Rentenberger, Jagannathan Rajagopalan

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

We used a novel diffraction-based method to extract the local, atomic-level elastic strain in nanoscale amorphous TiAl films during in situ transmission electron microscopy deformation, while simultaneously measuring the macroscopic strain. The complementary strain measurements revealed significant anelastic deformation, which was independently confirmed by strain rate experiments. Furthermore, the distribution of first nearest-neighbor distances became narrower during loading and permanent changes were observed in the atomic structure upon unloading, even in the absence of macroscopic plasticity. The results demonstrate the capability of in situ electron diffraction to probe structural rearrangements and decouple elastic and anelastic deformation in metallic glasses.

Original languageEnglish (US)
Pages (from-to)1-9
Number of pages9
JournalMaterials Research Letters
DOIs
StateAccepted/In press - Sep 22 2016

Fingerprint

Metallic glass
Diffraction
Transmission electron microscopy
Strain measurement
Amorphous films
Unloading
Electron diffraction
Plasticity
Strain rate
Experiments

Keywords

  • atomic rearrangements
  • in situ electron diffraction
  • local elastic strain
  • Metallic glass
  • strain rate experiments

ASJC Scopus subject areas

  • Materials Science(all)

Cite this

Revealing anelasticity and structural rearrangements in nanoscale metallic glass films using in situ TEM diffraction. / Sarkar, Rohit; Ebner, Christian; Izadi, Ehsan; Rentenberger, Christian; Rajagopalan, Jagannathan.

In: Materials Research Letters, 22.09.2016, p. 1-9.

Research output: Contribution to journalArticle

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