Abstract
Retrograde melting (melting upon cooling) is observed in silicon doped with 3d transition metals, via synchrotron-based temperature-dependent X-ray microprobe measurements. Liquid metal-silicon droplets formed via retrograde melting act as efficient sinks for metal impurities dissolved within the silicon matrix. Cooling results in decomposition of the homogeneous liquid phase into solid multiple-metal alloy precipitates. These phenomena represent a novel pathway for engineering impurities in semiconductor-based systems.
Original language | English (US) |
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Pages (from-to) | 3948-3953 |
Number of pages | 6 |
Journal | Advanced Materials |
Volume | 22 |
Issue number | 35 |
DOIs | |
State | Published - Sep 15 2010 |
Externally published | Yes |
ASJC Scopus subject areas
- General Materials Science
- Mechanics of Materials
- Mechanical Engineering